Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Beidou detector

A detector and Beidou technology, applied in the field of detectors, can solve the problems of not supporting multiple frequency points, high price, and many peripherals, and achieve the effect of avoiding the inconvenience of inspection and maintenance, saving high costs, and being easy to carry

Active Publication Date: 2017-02-22
湖南北云科技有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, a small number of domestic manufacturers undertaking Beidou tasks have developed navigation signal simulators, but generally only meet the requirements of equipment acceptance testing. These products have the disadvantages of large size, high price, many peripherals, and do not support multiple frequency points.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Beidou detector
  • Beidou detector
  • Beidou detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] Such as figure 1 As shown, the present invention includes a mainframe and a handheld darkroom. The host is connected to the handheld darkroom through a radio frequency cable, and the serial port of the user machine to be tested is connected to the host through a serial cable. The host is powered through a power cable.

[0037] During the test, the handheld darkroom is used to cover the antenna of the user machine to be tested, and then the serial port of the user machine to be tested is connected to the host computer, and the host computer controls the user machine to be tested to complete the closed-loop test function.

[0038] The host of the present invention includes a PC, a main board, a combiner and a case. The serial port and USB port of the PC are connected to the main board, and the B3 frequency point signal, S frequency point signal, B1 frequency point signal and L1 frequency point signal generated by the main board are transmitted to the handheld darkroom t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a Big Dipper detector. The Big Dipper detector comprises a host supporting multiple frequency point signals and a handheld dark chamber used for covering an antenna of a user machine to be detected. The host is connected with the handheld dark chamber through a radio frequency cable and a serial port of the user machine to be detected is connected with the host. The host comprises a PC, a radio frequency circuit, an FPGA module, a DDR2 module, a DAC module, an ADC module, a clock distribution module, an interface circuit, a USB module and a power module. The FPGA module is connected with an emission channel through the DAC module and the radio frequency circuit, and a receiving channel of the radio frequency circuit is connected with the FPGA module through the ADC module; the DDR2 module is connected with the FPGA module, the clock distribution module is connected with the FPGA module, the FPGA module is connected with a USB port of the PC through the USB module and the interface circuit, and the FPGA module is connected with the serial port of the PC through the interface circuit. The power module provides a power source. The Big Dipper detector is integrally designed and is convenient to use.

Description

technical field [0001] The invention relates to a detector, in particular to a Beidou detector. Background technique [0002] At present, a small number of domestic manufacturers undertaking Beidou tasks have developed navigation signal simulators, but generally only meet the requirements of equipment acceptance testing. These products have the disadvantages of large size, high price, many peripherals, and do not support multiple frequency points. Contents of the invention [0003] The purpose of the present invention is to provide a portable and highly integrated Beidou detector. [0004] The Beidou detector provided by the present invention includes a host computer supporting multiple frequency point signals and a handheld darkroom for covering the antenna of the user machine to be tested; the host computer is connected to the handheld darkroom through a radio frequency cable, and the serial port of the user machine to be tested Connect with the host; the host includes ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01S19/23
CPCG01S19/23
Inventor 向为易文鑫彭果张华朱增贤
Owner 湖南北云科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products