Detection circuit, liquid crystal display panel and manufacturing method of liquid crystal display panel

Abstract

The invention relates to a detection circuit, a liquid crystal display panel and a manufacturing method of the liquid crystal display panel. The detection circuit comprises a control switch unit which is arranged between a test signal input end and liquid crystal display panel signal lines and comprises a first switch transistor and a second switch transistor. In the period of detection, the first switch transistor and the second switch transistor are kept on, and a test signal is enabled to enter the liquid crystal display panel signal lines; after detection, the second switch transistor is kept off, the control end of the first switch transistor is in short-circuit connection with the first end, and accordingly leakage current flowing into the liquid crystal display panel signal lines from the second switch transistor is reduced. By the liquid crystal display panel with the detection circuit, risk of electric leakage between the signal lines in the panel is lowered effectively under the condition that operation is unaffected, and image display quality is ensured.

Description

technical field [0001] The invention relates to a liquid crystal display panel manufacturing process, in particular to a detection circuit, a liquid crystal display panel and a manufacturing method thereof. Background technique [0002] In the production process of liquid crystal display panels (LCD Panel), it is necessary to perform electrical testing (Cell Test) on the thin-film transistor array substrate to test whether the thin-film transistors on the array substrate that control the operation of each pixel unit are operating normally, so as to pick out abnormal ones. For array substrates, defective products are eliminated in time before the subsequent production process. The detection circuit used for electrical measurement is usually arranged in the non-display area of ​​the array substrate, and has two common wiring methods: short ring layout and short bar layout. Whether it is the detection circuit of the ring-shaped short-circuit wiring or the detection circuit of ...

AI Technical Summary

Problems solved by technology

For the case where thin film transistors are used as control switches (such as figure 1 As shown), when the display panel is working normally, the gate of the thin film transistor needs to be in a negative bias state for a long time, and its voltage characteristic curve (I-V Curve) may drift

At the same time, since the test short-circuit ring or short-circuit bar is suspended for a long time, its potential is easily disturbed and fluctuates greatly. Therefore, the conductive channel between the drain and source of the thin film transistor cannot be completely closed, and a leakage channel will be formed. Furthermore, different scanning lines or data lines form a leakage path ( figure 1 The dotted line shown), which causes the signals of different scan lines or data lines to interfere with each other, affecting the display effect of the panel

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