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Random impedance testing circuit and method for vector network analyzer material testing

An impedance test and circuit technology, applied in the measurement of resistance/reactance/impedance, measurement of electrical variables, instruments, etc., can solve the problems of low accuracy and complicated design of impedance conversion fixtures, and achieve the effect of high matching accuracy and enhanced sensitivity

Active Publication Date: 2015-02-25
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
  • Description
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Problems solved by technology

[0005] The invention proposes an arbitrary impedance testing circuit and method for material testing of a vector network analyzer, which solves the problems of cumbersome design of impedance conversion fixtures and low precision in the prior art

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  • Random impedance testing circuit and method for vector network analyzer material testing
  • Random impedance testing circuit and method for vector network analyzer material testing
  • Random impedance testing circuit and method for vector network analyzer material testing

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0029] Such as figure 1 As shown, any impedance test circuit of the present invention includes: frequency reference, single frequency signal source S 1 , local oscillator source L 0 , a coupling link module, a vector receiver A and a vector receiver R, a computer module and an impedance matching module.

[0030] Wherein, the vector receiver A and the vector receiver R also include an intermediate frequency conditioning module, an AD sampling module and a DSP...

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Abstract

The invention provides a random impedance testing circuit. The random impedance testing circuit comprises a frequency reference, a single-frequency signal source S1, a local oscillator L0, a coupling link module, a receiver A, a receiver B, a computer module and a impedance matching module; the receiver A and the receiver B each comprise an intermediate frequency conditioning module, an AD sampling module and a DSP module; the impedance matching module comprises a power divider, an adjustable attenuator, an adjustable phase shifter and a differential amplifier. By means of the random impedance testing circuit, a vector network analyzer can be tuned to be at any impedance, and the sensitivity of a system for conducting material testing is strengthened; compared with an impedance transition clamp with the conversional method, complex clamps do not need to be designed, time and labor are saved, and the matching accuracy is high.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an arbitrary impedance testing circuit for material testing of a vector network analyzer, and also relates to an arbitrary impedance testing method for material testing of a vector network analyzer. Background technique [0002] At present, there are only two kinds of impedance standards for general-purpose vector network analyzers, one is 50Ω and the other is 75Ω. The vast majority of device tests are standard tests, and two standards are sufficient. [0003] However, under the condition of using vector network analysis to test some high-impedance materials, such as thin films with substrates and fixtures filled with the tested materials, the impedance is not concerned during analysis, but the dielectric constant and dielectric loss , nonlinear parameters and other material properties, at this time the test sensitivity of the vector network analyzer to these parameters will be ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/28
Inventor 杨保国梁胜利王尊峰年夫顺
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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