High-resolution time interval measurer with function of automatic correction

Abstract

The invention relates to a high-resolution time interval measurer with a function of automatic correction. An automatic correction circuit is added on the basis of the prior art. The automatic correction circuit generates a correction start signal pulse, a correction stop signal pulse and a system clock and inputs them into an input conditioning circuit, thus generating time intervals Delta tstart and Delta tstop with pulse widths T1 (positive phase clock) and T2 (inverse phase clock); time intervals Nstart_1 and Nstop_1 (positive phase clock) and Nstart_2 and Nstop_2 (inverse phase clock) are measured in time-amplitude converters TAC1 and TAC2; the pulse widths T1 and T2 are known; thus, by calculating according to the pulse widths T1 and T2, the influence of gain coefficient and delay skew can be counteracted, a time interval to be measured is corrected, and time interval measuring precision is further improved.

Description

technical field [0001] The invention belongs to the technical field of time interval measurement, and more specifically relates to a high-resolution time interval measurement device with an automatic correction function. Background technique [0002] High-resolution time interval measurement technology is widely used in various scientific research and production fields such as electronic instruments, laser ranging, and physical experiments, and is the basic technology in these fields. Currently widely used time interval measurement methods mainly include direct counting method, analog interpolation method, digital vernier method, delay line method and time-amplitude conversion method. [0003] The direct counting method converts the measured signal into a gate signal, controls the high-speed circuit to count the high-speed clock, and obtains the time interval of the measured signal. The principle of this method is relatively simple, but to achieve picosecond-level accuracy,...

AI Technical Summary

Problems solved by technology

[0011] To achieve high-resolution time interval measurement on the order of several picoseconds, a TAC converter with very low noise and low-temperature drift characteristics can be used, but its temperature drift still exists and cannot be completely eliminated. As the temperature is different, the conversion result has a deviation in the gain

In addition, the delay of the digital logic device of the system also changes with the temperature, which brings time offset deviation, so the whole measurement device still has "slow drift".

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