Method and device for measuring non-uniformity of critical current density of surface layer of high-temperature superconducting bulk material

A technology of critical current density and high-temperature superconductivity, which is applied in the field of magnetic measurement, can solve problems such as the inability to obtain critical current density, and achieve the effect of ensuring stability

Active Publication Date: 2015-04-01
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The first one is based on the calculation and analysis of the average magnetization of the superconducting block placed in the magnetic susceptibility meter, so the value of the critical current density at different depths from the surface of the high-temperature superconducting block cannot be obtained
The second method currently only measures and analyzes superconducting bulk materials with uniform critical current density characteristics, and does not analyze and characterize the situation due to the inhomogeneity of critical current density distribution in the measurement. Therefore, for superconducting bulk materials Magnetic measurement of the critical current density distribution in the surface layer has not been reported yet

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  • Method and device for measuring non-uniformity of critical current density of surface layer of high-temperature superconducting bulk material
  • Method and device for measuring non-uniformity of critical current density of surface layer of high-temperature superconducting bulk material
  • Method and device for measuring non-uniformity of critical current density of surface layer of high-temperature superconducting bulk material

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Embodiment Construction

[0030] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0031] The invention provides a method and device for measuring the non-uniformity of critical current density on the surface of a high-temperature superconducting block, such as figure 1 As shown, the measuring device includes an excitation coil 1 , a secondary coil 2 , a coil support 3 , a sample platform 4 to be tested, a lock-in amplifier 11 , a power amplifier 12 , a precision resistor 6 and an impedance adjustment resistor 7 . Both the precision resistor 6 and the impedance adjusting resistor 7 are connected in series on the excitation coil 1, and the measurement method and device mentioned in the present invention can be used to measure the inhomogeneity of critical current density on the surface layer of high temperature superconducting bulk material.

[0032] Wherein, the excitation coil 1 is wound on the coil support 3 , the secondary coil 2...

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Abstract

The invention discloses a method and a device for measuring non-uniformity of critical current density of a surface layer of a high-temperature superconducting bulk material and belongs to the technical field of magnetic measurement. The measuring device comprises a magnet exciting coil, a secondary coil, a coil bracket, a to-be-measured sample platform, phase-locked amplifiers, a power amplifier, a precision resistor and an impedance regulation resistor; the measuring method comprises the following steps: firstly, fully cooling the to-be-measured sample platform, the magnet exciting coil, the secondary coil and to-be-measured high-temperature superconducting samples in absence of a magnetic field; then calculating to obtain an exciting current peak value and a tertiary harmonic voltage peak value of the secondary coil under the output voltage of each phase-locked amplifier; calculating critical current density values and transmission depths of the to-be-measured high-temperature superconducting samples under the exciting magnetic field strength and drawing a curve. The device and the method can be used for measuring the non-uniformity of critical current density of the surface layer of the high-temperature superconducting bulk material; the measurement error range is 10%; the voltage signals can be measured; the measurement precision is up to 1nV.

Description

technical field [0001] The invention belongs to the technical field of magnetic measurement, and can be applied and extended in the fields of superconducting material research, strong magnet design, magnetic levitation, etc., and specifically relates to a method and device for measuring the non-uniformity of critical current density on the surface of a high-temperature superconducting bulk material. Background technique [0002] With the development of high-temperature superconducting technology, high-temperature superconducting bulk materials are gradually moving towards practicality, and have a wide range of applications in superconducting magnetic levitation trains, magnetic levitation bearings, permanent magnets with strong magnetic fields, superconducting energy storage flywheels and superconducting motors. prospect. The performance parameters involved in these applications mainly depend on the ability of the superconducting material to capture the magnetic field, and i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/08
Inventor 王三胜贺同福
Owner BEIHANG UNIV
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