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Statistical Distribution Analysis Mapping Representation Method of Original Position of Material

A technology of original position and statistical distribution, applied in the direction of material inspection products, instruments, electrical digital data processing, etc., to achieve good correspondence and good statistical representative effect

Active Publication Date: 2020-06-30
CENT IRON & STEEL RES INST
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AI Technical Summary

Problems solved by technology

[0004] The current in-situ statistical distribution analysis technology of spark source and laser source has been able to realize the statistical and quantitative distribution of the content and state of each element in different positions in the material in a large-scale range. The recently developed high-throughput digital full-field metallographic characterization analysis The instrument can realize the large-scale range (cm 2 level), automatic identification, automatic rating, and in-situ statistical distribution analysis of various metallographic structures, but how to correspond to the macroscopic mechanical properties of the obtained large amount of component content and in-situ statistical distribution information of metallographic structures remains to be done. further research

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  • Statistical Distribution Analysis Mapping Representation Method of Original Position of Material
  • Statistical Distribution Analysis Mapping Representation Method of Original Position of Material
  • Statistical Distribution Analysis Mapping Representation Method of Original Position of Material

Examples

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Embodiment 1

[0047] Select a FeSi alloy sample (Si is 6.5%, C is 0.4%), polished by metallographic sample preparation method and corroded by dilute nitric acid alcohol to obtain the microstructure;

[0048] In the range of 5*5mm, use electronic probe in-situ statistical distribution analysis technology, high-throughput digital full-field metallographic characterization analyzer and scanning micro-Vickers hardness analyzer for surface scanning to obtain the original hardness within this range. C, Si content distribution, gray scale (structure) and Vickers hardness (mechanical properties) distribution information on the position (as shown in Figures 1 to 4);

[0049] Divide the scanning surface into 49 analysis areas, such as Figure 5 shown. Statistically analyze the data in these 49 small areas. The average composition contents of C and Si corresponding to the 49 analysis areas are shown in Table 1 and Table 2, and the gray scale and Vickers hardness values ​​are shown in Table 3 and Tabl...

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Abstract

The invention belongs to the technical field of material characterization and in particular relates to a statistical distribution analysis mapping characterization method for an original material position. The method comprises the following steps: performing polishing corrosion on a metal sample; performing high-flux statistical distribution analysis characterization on the component content and state of the original material position; performing high-flux quantitative statistical distribution characterization on the metallographic structure of the material; performing high-flux quantitative statistical distribution characterization on the micromechanical properties of the material; and segmenting a scanning surface into multiple analysis areas, and establishing a statistical mapping model between component-structure-mechanical property basic unit data sets in the same area, establishing a component-structure-mechanical property relational database, and performing the in-situ statistical distribution analysis mapping characterization on the micro area of the material. The method disclosed by the invention provides an objective data support for researching the corresponding relationship of the component, structure and mechanical property of the material and has significance on novel material research and development, material modification and process optimization.

Description

technical field [0001] The invention belongs to the technical field of material characterization, and in particular relates to a statistical distribution analysis and mapping characterization method of the original position of a material. Background technique [0002] The chemical composition and microstructure of materials are closely related to the properties of materials, so the characterization results become an important basis for material workers to judge material properties. The current characterization methods for the chemical composition of materials include macroscopic characterization, microscopic characterization, and in-situ statistical distribution analysis characterization methods. [0003] The macroscopic characterization of the chemical composition of a material generally refers to the analysis of the average chemical composition of the material, which reflects the basic properties of the material; the analysis of the microstructure of the material is usuall...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N33/20G06F119/00
Inventor 王海舟贾云海李冬玲赵雷钟振前
Owner CENT IRON & STEEL RES INST
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