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STACKED 3D MEMORY and manufacturing method thereof

一种存储器、存储区块的技术,应用在只读存储器、静态存储器、半导体/固态器件制造等方向,能够解决中间结构断裂、限制、难蚀刻等问题

Active Publication Date: 2015-05-06
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the structure with high aspect ratio is more difficult to etch, for example, the intermediate structure may break during the process, etc., so this structure also has its limitations

Method used

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  • STACKED 3D MEMORY and manufacturing method thereof
  • STACKED 3D MEMORY and manufacturing method thereof
  • STACKED 3D MEMORY and manufacturing method thereof

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0071] A detailed description of several embodiments of the present technology will be provided below with reference to the accompanying drawings.

[0072] figure 1 A simplified schematic diagram of a stacked 3D memory that includes multiple memory blocks. The structure includes a first block including a memory core 104 and a decoder area 114 . The second block is disposed on the first block and includes the memory core 103 and the decoder area 113 . A third block is disposed above the second block and includes the memory core 102 and the decoder area 112 . A fourth block in the stack includes memory core 101 and decoder area 111 . An isolation layer (such as the isolation layer 123 ) is disposed between the blocks. A plurality of access conductors are disposed in the decoder areas 111-114. Multiple sections of multiple access conductors are disposed in the isolation layers 121 - 123 . In this embodiment, a plurality of access conductor sections 151 - 153 are disposed in...

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PUM

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Abstract

A memory can include a plurality of memory blocks, including a first block and a second block disposed over the first block. An isolation layer is disposed in this structure, between the first and second blocks to isolate the vertical conductors in the memory kernels of the first and second blocks. Access conductors are provided outside the kernels, such as adjacent the memory blocks or through regions of the blocks that only include decoding element. The access conductors are coupled to the decoding elements in the first and second blocks, and provide for connection of the memory cells to peripheral circuits.

Description

technical field [0001] The present invention relates to high density memory technology, including technology of 3D arrays of memory cells. Background technique [0002] High-density flash memory is used as non-volatile storage in many systems. NAND flash memory is one of the common structures, and is usually arranged in a two-dimensional memory cell array. As manufacturing technology advances, the nodes (nodes) become smaller and smaller, and the two-dimensional NAND flash memory has reached its physical limit. Therefore, many other techniques have been developed. [0003] In the trend of achieving high storage capacity of flash memory and other types of memory, designers have devoted themselves to finding technologies for stacking multiple layers of memory cells to achieve higher storage capacity and lower cost per bit. For example, in the IEEE International Electronic Components Conference on December 11-13, 2006, Mr. Lai and others published "A Multi-Layer Stackable Th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/06H01L27/115H01L21/8247
CPCH10B41/50H10B41/27H10B43/50H10B43/27H01L21/76895
Inventor 陈士弘
Owner MACRONIX INT CO LTD