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Optical scanning holographic image edge extracting method based on double-hole pupil

An optical scanning and edge extraction technology, which is applied in the field of optical scanning holographic technology and three-dimensional imaging, can solve the problems of increasing complexity of the experimental system, and achieve the effect of simple structure, easy operation, and clear object image edge extraction

Inactive Publication Date: 2015-05-13
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

This method can obtain clearer edge information, but the complexity of the experimental system also increases to a certain extent

Method used

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  • Optical scanning holographic image edge extracting method based on double-hole pupil
  • Optical scanning holographic image edge extracting method based on double-hole pupil
  • Optical scanning holographic image edge extracting method based on double-hole pupil

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Embodiment Construction

[0046] The present invention will be further described below in conjunction with the accompanying drawings.

[0047] A method for extracting the edge of an optical scanning holographic image based on a double-hole pupil, comprising the following steps:

[0048] Step 1: Set the dual aperture pupil to P 2a (x,y)=δ(x-x 1 ,y-y 1 ), get the first Fresnel zone plate h 1 , perform the first two-dimensional holographic scan to obtain a hologram.

[0049] Step 2: Set the dual aperture pupil to P 2b (x,y)=δ(x-x 2 ,y-y 2 ), get the second Fresnel zone plate h 2 , perform a second two-dimensional holographic scan to obtain a hologram.

[0050] Step 3: Perform Fourier transform on the hologram of the two-dimensional holographic scanning, and introduce the conjugate gradient method to solve the inverse problem.

[0051] The specific structure of this embodiment is as figure 1 As shown, the center wavelength of the single-wavelength light source used is 632nm. The sample to be tes...

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Abstract

An optical scanning holographic image edge extracting method based on a double-hole pupil belongs to the technical field of the optical scanning holographic technology. The method includes the following steps: 1 arranging the double-hole pupil to be that P2a (x, y)= sigma (x-x1, y-y1) to obtain a first Fresnel zone plate h1 and conduct first two-dimensional holographic scanning to obtain a hologram s1; 2 arranging the double-hole pupil to be that P2b (x, y)= sigma (x-x2, y-y2) to obtain a second Fresnel zone plate h2 and conduct second two-dimensional holographic scanning to obtain a hologram s2 to record more object high frequency information; 3 conducting Fourier transform on the holograms obtained through the two-dimensional holographic scanning, and a conjugate gradient method is introduced to conduct inverse problem solving. The method is simple in structure and easy to operate, has high practicability, can achieve edge extraction of clear objects and has high application value.

Description

technical field [0001] The invention belongs to the field of optical holographic imaging, and relates to optical scanning holographic technology and three-dimensional imaging technology. Background technique [0002] Optical Scanning Holography (OSH) is a kind of digital holography technology, which divides the beam into two different wavefronts for interference to form a Fresnel Zone Plate (FZP), and then realizes the High-resolution three-dimensional imaging of target objects has broad application prospects in biomedical imaging, deformation measurement, particle field testing, optical microscopy, and optical remote sensing. [0003] The two-dimensional hologram obtained by optical scanning holography technology contains the complete three-dimensional information of the sample, so how to extract the edge information of the sample image from the hologram has become a research hotspot in optical scanning holography. The edge of an image is the most basic feature of an image...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03H1/12
Inventor 欧海燕邵维王秉中
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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