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Measurement parameter processing method and system

A technology for testing parameters and parameters, which is applied in the field of communication, can solve the problems of easy errors in human operation, heavy workload, and inconsistent display of parameter interfaces, etc., and achieve the effect of improving human-computer interaction experience, lowering the threshold of use, and unifying the display style

Inactive Publication Date: 2015-05-13
DATANG LINKTESTER TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The present invention provides a test parameter processing method and system to solve the problem that the test parameter processing scheme in the traditional comprehensive tester needs to manually add UI and validity inspection, the workload is large, the interface display of the parameters is not uniform, and the manual operation is easy wrong question

Method used

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  • Measurement parameter processing method and system
  • Measurement parameter processing method and system

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Experimental program
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Effect test

Embodiment 1

[0050] A method for processing test parameters provided by an embodiment of the present invention is introduced in detail.

[0051] refer to Figure 4 , shows a flow chart of steps in a method for processing test parameters in an embodiment of the present invention.

[0052] Step 100, call the general parameter processing component to identify the pre-defined test parameters, and obtain the parameter types of the test parameters.

[0053] The parameter general processing component is the core functional component of the embodiment of the present invention, and the pre-defined test parameters can be adaptively processed by using the parameter general processing component.

[0054] The pre-defined test parameters have a corresponding relationship with the pre-performed test functions of the comprehensive tester, and to realize different test functions, different test parameters need to be defined in advance.

[0055] Step 102: Generate a display control corresponding to the te...

Embodiment 2

[0067] A method for processing test parameters provided by an embodiment of the present invention is introduced in detail.

[0068] refer to Figure 5 , shows a flow chart of steps in a method for processing test parameters in an embodiment of the present invention.

[0069] Step 200, judging whether the parameter general processing component supports the predefined test parameters; if yes, execute step 202; if not, the process ends.

[0070] The parameter general processing component can support most commonly used test parameters. For new test parameters, if the parameter general processing component does not support it, the relevant information of the new test parameter can be added to the parameter general processing component to realize the parameter general processing component The range of support is extended.

[0071] Wherein, the pre-defined test parameters may include parameter initial values, parameter valid ranges, parameter types, and the like.

[0072] Step 202...

Embodiment 3

[0092] A system for processing test parameters provided by an embodiment of the present invention is introduced in detail.

[0093] refer to Image 6 , shows a schematic structural diagram of a test parameter processing system in an embodiment of the present invention.

[0094] The test parameter processing system may include: a parameter type identification module 300 , a display control generation module 302 , a validity verification module 304 , a parameter conversion module 306 , and a loading display module 308 .

[0095] The functions of each module and the relationship between each module are introduced in detail below.

[0096] The parameter type identification module 300 is configured to call the parameter general processing component to identify the pre-defined test parameters, and obtain the parameter types of the test parameters.

[0097] The display control generation module 302 is configured to generate a display control corresponding to the test parameter acco...

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Abstract

The invention provides a measurement parameter processing method and system. The measurement parameter processing method comprises the steps that pre-defined measurement parameters are identified by calling a general parameter processing assembly, so that the parameter types of the measurement parameters are obtained; according to the parameter types of the measurement parameters, display controls corresponding to the measurement parameters are generated; according to the parameter type of the measurement parameters, effectiveness verification is conducted on the measurement parameters; parameter conversion is conducted on the pre-defined measurement parameters passing effectiveness verification; the display controls are loaded according to a preset order and the types by calling an automatic loading assembly, parameter information obtained after conversion of the parameters is displayed, and then processing of the measurement parameters is completed. By the adoption of the measurement parameter processing method and system, the coupling of software in a comprehensive measuring instrument is lowered, the stability of the software in the comprehensive measuring instrument is improved, and the measurement parameter self-adaptive function is achieved, the workload of workers for identifying the measurement parameters is lightened, the sense of approval of users for the comprehensive measuring instrument is improved, the operation processes of the measurement parameters are unified, and the use limitation is lowered for the users.

Description

technical field [0001] The invention relates to the technical field of communication, in particular to a method and system for processing test parameters. Background technique [0002] Terminal comprehensive tester, referred to as comprehensive tester, is a measuring instrument that can be widely used in terminal design, research and development, production and other fields. It is mainly used to test terminal radio frequency indicators, including cellular and non-cellular systems, and can be used in combination , to meet other terminal auxiliary testing functions, such as some protocol functions, business, power consumption, reliability testing, etc. At the same time, the comprehensive tester can also be applied to the certification test of terminal radio frequency consistency. The comprehensive tester can test multiple aspects of the terminal, and the corresponding functions it supports are also very rich, and each test function needs to configure the corresponding test pa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 王启华王福
Owner DATANG LINKTESTER TECH
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