Defect detecting method and defect detecting device

A defect detection and defect technology, applied in the computer field, can solve problems such as poor detection effect, failure to detect defects, and low contrast.

Active Publication Date: 2015-05-13
BEIJING C&W ELECTRONICS GRP +1
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Problems solved by technology

like figure 1 It is a schematic diagram of a plate image with low-contrast defects collected from an industrial production line, figure 2 It is a schematic diagram of the defect detection resul...

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  • Defect detecting method and defect detecting device
  • Defect detecting method and defect detecting device

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Embodiment Construction

[0054] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0055] see image 3 , the embodiment of the present invention proposes a defect detection method, including the following steps:

[0056] Step 301: Obtain an ROI image.

[0057] Step 302: Set two thresholds, perform binarization on the normal pixels of the ROI image whose pixel values ​​are within the two threshold intervals, and the defective p...

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Abstract

The invention provides a defect detecting method and a defect detecting device. The method comprises the steps of acquiring an image of a region of interest (ROI); setting two threshold values, performing binarization processing on the ROI image according to normal pixel points of the ROI image with the pixel value within the two threshold values and defect pixel points of the ROI image with the pixel value beyond the two threshold values, so as to obtain a binarization image; performing vertical projection and/or horizontal projection on the defect pixel points of the acquired binarization image so as to obtain projection images of the defect points; and detecting the defects from the projection images. The method can realize detection of low contrast defects.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a defect detection method and device. Background technique [0002] In recent years, more and more attention has been paid to the research of machine vision in the world. The machine vision technology based on image processing technology mainly uses computers to simulate people or reproduce some intelligent behaviors related to human vision, and extract information from the images of objective things. processed, understood, and ultimately used for practical detection and control. It is mainly used in industrial inspection, industrial flaw detection, precision measurement and control, automatic production line, etc. Using machine vision detection method can not only greatly improve production efficiency and production automation, but also machine vision can easily realize information integration and meet the requirements of digital and automatic production. In industrial produ...

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Application Information

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IPC IPC(8): G06T7/00
CPCG06T7/0008G06T2207/20068G06T2207/30164
Inventor 王新新邹伟金李晨徐江伟
Owner BEIJING C&W ELECTRONICS GRP
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