Defect detecting method and defect detecting device

Abstract

The invention provides a defect detecting method and a defect detecting device. The method comprises the steps of acquiring an image of a region of interest (ROI); setting two threshold values, performing binarization processing on the ROI image according to normal pixel points of the ROI image with the pixel value within the two threshold values and defect pixel points of the ROI image with the pixel value beyond the two threshold values, so as to obtain a binarization image; performing vertical projection and / or horizontal projection on the defect pixel points of the acquired binarization image so as to obtain projection images of the defect points; and detecting the defects from the projection images. The method can realize detection of low contrast defects.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a defect detection method and device. Background technique [0002] In recent years, more and more attention has been paid to the research of machine vision in the world. The machine vision technology based on image processing technology mainly uses computers to simulate people or reproduce some intelligent behaviors related to human vision, and extract information from the images of objective things. processed, understood, and ultimately used for practical detection and control. It is mainly used in industrial inspection, industrial flaw detection, precision measurement and control, automatic production line, etc. Using machine vision detection method can not only greatly improve production efficiency and production automation, but also machine vision can easily realize information integration and meet the requirements of digital and automatic production. In industrial produ...

AI Technical Summary

Problems solved by technology

like figure 1 It is a schematic diagram of a plate image with low-contrast defects collected from an industrial production line, figure 2 It is a schematic diagram of the defect detection result of the plate image by the existing defect detection technology, from figure 2 It can be seen that using the above existing methods, some defects cannot be detected, and the detection effect is poor.

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