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Cluster fault analysis method based on event-driven analysis

A fault analysis method and event-driven technology, applied in special data processing applications, instruments, electrical and digital data processing, etc., can solve problems such as incompetence in calculation, and achieve the effect of improving analysis and solution efficiency and ensuring normal operation.

Inactive Publication Date: 2015-05-27
INSPUR GROUP CO LTD
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Problems solved by technology

[0006] Some computing-intensive applications, such as: weather forecast, nuclear test simulation, etc., require computers to have strong computing and processing capabilities. With the existing technology, even ordinary mainframes are difficult to perform calculations

Method used

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  • Cluster fault analysis method based on event-driven analysis

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Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] The cluster failure analysis method based on event-driven analysis includes an event analyzer and an event failure library. On the cluster server, a daemon process is run to collect cluster event data, and then the collected data is sent to the event analyzer. The cluster event data is analyzed and modeled, and continuously improved; when a fault occurs, the event of the faulty machine is obtained in time, and the fault event is automatically matched with the event fault database to identify it, thereby analyzing the cause of the fault, and giving Analysis and solution methods help to quickly solve and locate faults, and finally present the results to users.

[0024] The cluster event data includes server logs, controller time, and transactions, and these events include status changes of the cluster itself, as well as external input and output.

[0025] The e...

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Abstract

The invention particularly relates to a cluster fault analysis method based on event-driven analysis. The cluster fault analysis method based on event-driven analysis comprises an event analyzer and an event fault database. According to the cluster fault analysis method based on event-driven analysis, cluster event data such as server logs, controller events and transactions are collected, and the collected cluster event data are analyzed; the fault events of a cluster server are automatically matched with the event fault database, so that fault reasons are analyzed; an analysis and solving method is provided, so that the analysis efficiency and the solving efficiency of the cluster server fault events are improved, and the normal operation of the cluster server is ensured.

Description

technical field [0001] The invention relates to the technical field of cluster fault analysis, in particular to a cluster fault analysis method based on event-driven analysis. Background technique [0002] Cluster technology is a relatively new technology, through cluster technology, relatively high benefits in terms of performance, reliability, and flexibility can be obtained at a lower cost. [0003] A cluster is a group of independent computers interconnected by a high-speed network that form a group and are managed as a single system. When a client interacts with the cluster, the cluster behaves like a stand-alone server. Cluster configurations are used to improve availability and scalability. [0004] The purpose of adopting cluster technology includes the following points: [0005] 1 Improve performance [0006] Some computing-intensive applications, such as: weather forecast, nuclear test simulation, etc., require computers to have strong computing and processing ...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 姜伟丽冯江辉
Owner INSPUR GROUP CO LTD
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