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Method for calibrating setting values and measurement values in shmoo test

A technology of setting value and measurement value, applied in the field of calibrating the setting value and measurement value in shmoo test, it can solve the problems of high business trip risk and low analysis efficiency, and achieve the goal of improving efficiency, improving speed and reducing the risk of human error. Effect

Inactive Publication Date: 2015-06-03
SINO IC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method for calibrating the set value and measured value in the shmoo test, to solve the problem of low test analysis efficiency and high risk of business trip in the shmoo test

Method used

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  • Method for calibrating setting values and measurement values in shmoo test
  • Method for calibrating setting values and measurement values in shmoo test
  • Method for calibrating setting values and measurement values in shmoo test

Examples

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Embodiment 1

[0029] Such as Figure 4 As shown, the present invention provides a method for calibrating the set value and the measured value in the shmoo test, which includes the following steps:

[0030] S1: Select one or more parameters of the tested chip.

[0031] When performing a shmoo test on the tested chip, it may be necessary to perform a shmoo test on one parameter of the tested chip, or it may be necessary to perform a shmoo test on two or three parameters of the tested chip at the same time. Therefore, when the shmoo test is performed on the tested chip, the number of parameters is selected as 1, 2, or 3 according to actual needs.

[0032] When the chip under test requires more than 3 parameters for shmoo test, for example, 5 or more, it can be performed step by step. First select 3 parameters for shmoo test, and then perform shmoo test on the remaining 2 parameters Perform shmoo test, if the correlation between the 5 parameters is relatively large, you can also cross-group the shmoo...

Embodiment 2

[0041] The method of calibrating the setting value and the measurement value in the shmoo test of the embodiment 2 is basically the same as the method of calibrating the setting value and the measurement value in the shmoo test of the embodiment 1, the difference is that the parameter is Two, the specific steps are as follows:

[0042] S1: Select one or more parameters of the tested chip.

[0043] In this embodiment, there are two parameters, the first parameter and the second parameter.

[0044] S2: Set the set value range and step of the parameter, and scan the parameter according to the step and the set value range.

[0045] Specifically, the setting value range of the parameter is between the minimum setting value of the parameter and the maximum setting value of the parameter. The minimum setting value, the maximum setting value and the step of the first parameter and the second parameter are respectively set. And the minimum setting value of the parameter is greater than the m...

Embodiment 3

[0053] The method of calibrating the set value and the measured value in the shmoo test of Example 3 is basically the same as the method of calibrating the set value and the measured value in the shmoo test of Example 1. The difference is that the parameter is Three, the specific steps are as follows:

[0054] S1: Select one or more parameters of the tested chip.

[0055] In this embodiment, there are three parameters, which are the first parameter, the second parameter and the third parameter.

[0056] S2: Set the set value range and step of the parameter, and scan the parameter according to the step and the set value range.

[0057] Specifically, the setting value range of the parameter is between the minimum setting value of the parameter and the maximum setting value of the parameter. Set the setting value ranges of the first parameter, the second parameter and the third parameter respectively, that is, set the minimum setting value, maximum setting value and step of the first pa...

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Abstract

The invention provides a method for calibrating setting values and measurement values in a shmoo test. The method comprises the following steps: selecting one or multiple parameters of a tested chip; setting the setting value range and stepping of the parameters, and scanning the parameters according to the stepping and the setting value range; displaying a shmoo test result diagram. In the shmoo test result diagram, the setting value range of the parameters, the stepping of the setting values and the measurement values of the parameters are directly marked, a program engineer does not need to confirm after searching program codes, the differences between the setting values and the measurement values of the parameters are clear at a glance when the shmoo test result diagram is analyzed by a technician in the shmoo test process, and the speed that the technician determines the optimal setting values of the parameters is increased, so that the efficiency is improved, and manual error risks are reduced.

Description

Technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a method for calibrating set values ​​and measured values ​​in shmoo testing. Background technique [0002] There will be various differences between the finished chip and the chip on the whole wafer. In order to make the test procedure suitable for this difference, some sensitive test items need to be shmoo tested to find the best fit for the chip. set up. [0003] The shmoo test is a common technical method in chip testing. Now most ATEs have shmoo testing functions. The purpose of shmoo testing is to find the difference between the actual characteristics of the chip and the test procedure, thereby improving the test procedure. However, the shmoo test result graphs obtained in the prior art are relatively simple, such as figure 1 , 2 , 3, only by relying on a shmoo test result graph, you can only see the set values ​​of the parameters when the chip passes the test,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 王玉龙牛勇邵嘉阳凌俭波郝丹丹王华
Owner SINO IC TECH