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Network protocol performance test bed system for wireless sensor network and testing method

A wireless sensor network and network protocol technology, applied in the field of wireless sensor network protocol testing, to achieve the effect of improving the efficiency of upgrades and status queries

Active Publication Date: 2015-06-10
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0005] However, during the construction of the sensor network protocol measurement platform, there are also some problems

Method used

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  • Network protocol performance test bed system for wireless sensor network and testing method
  • Network protocol performance test bed system for wireless sensor network and testing method
  • Network protocol performance test bed system for wireless sensor network and testing method

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Embodiment Construction

[0033] Below in conjunction with specific embodiment, further illustrate the present invention. It should be understood that these examples are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the teachings of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims of the present application.

[0034] From the perspective of hardware equipment, the test bed of the present invention consists of three parts: a test host, a test gateway, and a test floor device. The test host is an ordinary computer or server; the test gateway is composed of a networking communication module and an Ethernet communication module; the test host and the test gateway are connected through a router device; the test baseboard equipment include...

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Abstract

The invention relates to a network protocol performance test bed system for a wireless sensor network and a testing method, and aims at quickly distributing test codes and quickly acquiring test state parameters based on common hardware interface facilities and a clustering network topology structure. The test bed system is that the target is to quickly and reliably distribute and update the codes; the unified manner and format are adopted in an internal memory section of the sensor network protocol, the protocol code deployment and distribution method of distributing global code data and supplementing local codes is carried out, and thus the time of one-time replacement of global codes can be reduced to the maximum. The system is applicable to the low-power-consumption sensor network and the corresponding M2M application; the test of various types of wireless sensor network application protocols can be effectively carried out, and thus the sensor network protocol development efficiency can be increased.

Description

technical field [0001] The invention relates to the technical field of wireless sensor network protocol testing, in particular to a wireless sensor network-oriented network protocol performance test bed system and a testing method. Background technique [0002] The test of the wireless sensor network protocol is a link that must be faced in the protocol development process, and it is also the longest time-consuming and most complicated part of the implementation process in the protocol development process. [0003] From the perspective of sensor network system integration and application testing, most of the current research is verified and tested through theoretical analysis and computer simulation. Although the method of theoretical analysis can compare multiple protocols of the same kind, the construction of mathematical models requires a lot of simplification when applying these models to solve practical problems due to the high computational complexity, which reduces th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04W24/02H04W84/18
CPCH04W24/02H04W84/18Y02D30/70
Inventor 张帅何为周苗华昕佳王晶楔超朱磊基杨旭光赵康
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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