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A temperature control method of refrigeration structure based on integrated dewar assembly variable temperature test

A Dewar component, an integrated technology, applied in the direction of temperature control, non-electric variable control, control/regulation system, etc., can solve the problem of shortening the packaging cycle, and achieve the effects of stable results, simple implementation methods, and high test accuracy.

Active Publication Date: 2016-11-30
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The purpose of the present invention is to provide a temperature control method for the refrigeration structure of the integrated Dewar module internal variable temperature test, which solves the problem of non-interference testing of the detector performance and shortening the packaging cycle during the coupling and packaging process of the detector and the refrigerator, and meets the detection requirements. Requirements for performance control of device performance in the packaging process

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  • A temperature control method of refrigeration structure based on integrated dewar assembly variable temperature test
  • A temperature control method of refrigeration structure based on integrated dewar assembly variable temperature test
  • A temperature control method of refrigeration structure based on integrated dewar assembly variable temperature test

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Embodiment Construction

[0048] The specific embodiment of the present invention is described in further detail below in conjunction with accompanying drawing:

[0049] The embodiment is a performance test of an ultra-long line infrared detector focal plane integrated Dewar component detector, as attached figure 1 As shown, its main implementation method is as follows:

[0050] 1. The preparation method and assembly sequence of each part of the refrigeration structure used in the variable temperature test in the integrated Dewar assembly in the present invention are as follows:

[0051] a) The core column 7 is made of stainless steel 304L material, the wall thickness is 0.15mm, and the outer surface is polished. This part plays the role of liquid nitrogen storage refrigeration and low solid conduction heat leakage. The material of the cold head 10 is high conductivity oxygen-free copper, and the outer surface is polished. The lower end of the core column 7 and the cold head 10 are connected by vacuu...

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Abstract

The invention discloses a temperature control method based on an integrated Dewar component temperature change testing refrigeration structure. The integrated Dewar component temperature change testing refrigeration structure comprises an epoxy pull rod handle, an epoxy pull rod, a liquid nitrogen cavity sealing cover plate, a shell, a liquid nitrogen storage cavity, a Dewar integrally-supporting small-end sealing cover plate, a stem, a stop rod cap, a liquid nitrogen tray, a cold head, a temperature measurement platinum resistor, a lead, a lead ring, a Dewar integrally-supporting sealing bottom plate, a heating resistor and a Dewar integrally-supporting big-end sealing cover plate. According to the temperature control method based on the integrated Dewar component temperature change testing refrigeration structure, the refrigeration structure which can achieve the 85-130K testing temperature by adjusting the different distances between the liquid nitrogen surface and the cold platform is designed, and accurate control over the testing temperature is achieved through heat compensation; interference of vibration of a compressor of a refrigerator and electromagnetic interference are avoided in the whole testing process, testing precision is high, and results are stable; the temperature control method is suitable for testing of the performance of a detector through an integrated Dewar component formed by coupling a linear pulse pipe refrigerator and the detector.

Description

technical field [0001] The present invention relates to an integrated dewar component packaging technology, specifically a temperature control and temperature measurement method for a refrigeration structure used in the packaging process of an integrated ultra-long-line infrared focal plane dewar component to perform a temperature-variable test on a detector. It is suitable for the process test of detector performance in a linear pulse tube refrigerator and detector integrated coupling type Dewar assembly. Background technique [0002] With the improvement of requirements for spatial resolution and detector sensitivity, infrared focal plane detectors often adopt the method of splicing detector chip modules in line or array to improve the resolution. For infrared focal plane detectors using this type of splicing method, the requirements for operating temperature and temperature uniformity are high, so the integrated coupling method of Dewar components and linear pulse tubes i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05D23/20
Inventor 李俊孙闻王小坤陈俊林曾智江郝振贻李雪
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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