Low-cost high-precision LED node temperature measuring instrument

Abstract

The utility model provides a low-cost high-precision LED node temperature measuring instrument. The low-cost high-precision LED node temperature measuring instrument comprises a forward pressure drop detection unit, a data obtaining device, a mercury switch and an LED driver. The LED driver is a constant current source, the data obtaining device can be electrically connected with the forward pressure drop detection unit, and the mercury switch can switch an LED node to be measured to an equivalent load from the LED driver during a measuring process and switch the LED node to the LED driver from the equivalent load.

Description

technical field [0001] The invention relates to an LED junction temperature measuring instrument, in particular to a low-cost, high-precision LED junction temperature measuring instrument. Background technique [0002] US Patent Nos. 8,278,831; 7,758,240; 7,052,180; 5,401,099 respectively describe different ways of measuring semiconductor junction temperatures, all of which can also be used to measure LED junction temperatures. However, one disadvantage of all these measuring instruments is that they are only suitable for laboratory environment and simple junction temperature measurement. In these patents, the measured devices are simple and compact devices, and the connections between these devices and the measuring instruments are short, so they have very small parasitic capacitance, leakage inductance and low noise. However, when actually testing the junction temperature of LEDs, the device to be measured may be very complex and bulky, and it has much larger parasitic ca...

AI Technical Summary

Problems solved by technology

However, one disadvantage of all these measuring instruments is that they are only suitable for laboratory environments and simple junction temperature measurements

In these patents, the measured devices are simple and compact devices, and the connections between these devices and the measuring instruments are short, so they have very small parasitic capacitance, leakage inductance and low noise

However, when actually testing the junction temperature of LEDs, the device to be measured may be very complex and bulky, and it has much larger parasitic capacitance and leakage inductance in the system. In addition, the noise of the factory will be much larger than that of the laboratory. many

In view of this, the method described in the above patent is not suitable for the actual operation of LED junction temperature test, and the factory environment

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