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Clustered scan method of a capacitive touch device

一种电容式触控、扫描方法的技术,应用在电数字数据处理、数据处理的输入/输出过程、仪器等方向,能够解决交互电容电容值失真等问题

Active Publication Date: 2015-08-19
ELAN MICROELECTRONICS CORPORATION
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When using a single positive voltage waveform or a negative positive voltage waveform to drive a driver, in addition to the mutual capacitance (Mutual Capacitor) between the driving line and the intersecting sensing line, when an object such as a finger approaches, the driving line and the finger There will be a parasitic self-capacitance between the sensing line and the finger. If the finger and the touch system do not share the same ground, the sensor (Sensor) will be affected by these parasitic self-capacitance influence, and interact with the interaction capacitance on the sensor during operation, which makes the measured capacitance value of the interaction capacitance distorted, especially in the case of poor common ground between the measurement system and the human body, it will be more serious

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  • Clustered scan method of a capacitive touch device

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Embodiment Construction

[0039] The present invention proposes a cluster scanning method applied to a capacitive touch device. The capacitive touch device can identify a single finger or multiple fingers. The present invention can improve the signal-to-noise ratio of the sensing quantity, and reduce the common ground between the measurement system and the human body. Adverse effects, and then solve the multi-finger positioning problem.

[0040] See first figure 1 As shown, it is a schematic diagram of a capacitive touch device 10 , which mainly includes a touch panel 11 , a driving circuit 12 and a sensing circuit 13 . The touch panel 11 can preferably choose a dual-axis touch panel, including n driving lines X1-Xn and m sensing lines Y1-Ym; wherein the driving lines X1-Xn are perpendicular to the sensing lines Y1-Ym Interleaving, each intersecting point is regarded as a sensing point. The main scanning steps of the cluster scanning method of the present invention are as follows:

[0041] Simultan...

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Abstract

A clustered scan method of a capacitive touch device has steps of simultaneously providing driving signals in one driving cycle to multiple driving lines including the (i−j)th drive line to the (i+k)th drive line, and simultaneously providing driving signals in a next driving cycle to the drive lines including some of the drive lines driven in the previous driving cycle with a sum of the driving signal in each driving cycle greater than zero. When the stimulated drive lines include a bordering drive line, the driving lines are determined according to a relationship among i, j and k. Accordingly, the signal to noise ratio of the touch device can be increased and the adverse effect for common ground occurring between a measuring system and a human body can be reduced so that the multi-finger positioning issue can be resolved.

Description

technical field [0001] The invention relates to a scanning method of a capacitive touch device, in particular to a cluster scanning method of a capacitive touch device. Background technique [0002] At present, there are two common scanning methods for capacitive touch devices: self-capacitance scanning method and mutual capacitance scanning method; among them, the mutual capacitance scanning method proposes a variety of different mutual capacitance scanning methods according to the different needs of capacitive touch devices. The cluster scanning method is one of them. The following outlines a variety of different cluster scanning methods for illustration. [0003] For example, U.S. Patent No. 7,812,827 discloses a "SIMULTANEOUS SENSING ARRANGEMENT" (simultaneous sensing configuration) technology, which is also used on a capacitive touch device that consists of multiple driving lines and sensing lines interlaced to form multiple sensing points. This technology enables enha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/044
CPCG06F3/044G06F3/0416G06F3/04166G06F3/0446
Inventor 赵子萱陆亦翔林嘉兴郭泊灏李一书
Owner ELAN MICROELECTRONICS CORPORATION
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