Unlock instant, AI-driven research and patent intelligence for your innovation.

Thermal Simulation Equivalent Model of Amplifier Chip and Its Heat Sink Based on Phemt

A thermal simulation equivalent and equivalent model technology, applied in the field of effective models, can solve the problems such as the inability to provide accurate die channel temperature, the high cost of infrared measurement technology, and the lack of consideration of the influence of the die, and the modeling process is simple and convenient. , saving cost and time, accurate and reliable results

Active Publication Date: 2017-09-29
GREAT MICROWAVE TECH CO LTD
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Infrared measurement technology is costly and time-consuming, and it cannot provide accurate die channel temperature during the chip design stage, providing thermal reference data for chip design
Commonly used simulations only focus on the thermal characteristics of a single die, without considering the impact of chip layout, vias, and the entire chip structure layout on the die

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Thermal Simulation Equivalent Model of Amplifier Chip and Its Heat Sink Based on Phemt
  • Thermal Simulation Equivalent Model of Amplifier Chip and Its Heat Sink Based on Phemt
  • Thermal Simulation Equivalent Model of Amplifier Chip and Its Heat Sink Based on Phemt

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0017] Such as figure 1 As shown, this embodiment is a 0.1-watt K-band three-stage power amplifier chip, which includes an amplifier chip equivalent model 1 and a heat sink equivalent model 2. The equivalent model of the amplifier chip includes an active area and a metal interconnection layer 3 , a chip substrate 4 , metal vias 5 , and a gold back 6 . The active area and the metal interconnection layer 3 include an equivalent PHEMT die 7 and an equivalent layout 8, the equivalent layout 8 is distributed around the equivalent PHEMT die 7, and the active area and the metal interconnection layer 3 are distributed on the chip substrate 4 on the upper surface, metal vias 5 are built into the chip substrate 4, the back gold 6 is close to the lower surface of the chip substrate 4, and the equivalent heat sink 3 is fixed between the amplifier chip 2 and the constant temperature working surface 15 (70 degrees Celsius in this example) between. Such as figure 2 As shown, in the equiv...

Embodiment 2

[0023] Such as figure 1 As shown, this embodiment is a 0.5 watt Ka-band three-stage driver chip, which includes an amplifier chip equivalent model 1 and a heat sink equivalent model 2. The equivalent model of the amplifier chip includes an active area and a metal interconnection layer 3 , a chip substrate 4 , metal vias 5 , and a gold back 6 . The active area and the metal interconnection layer 3 include an equivalent PHEMT die 7 and an equivalent layout 8, the equivalent layout 8 is distributed around the equivalent PHEMT die 7, and the active area and the metal interconnection layer 3 are distributed on the chip substrate 4 on the upper surface, metal vias 5 are built into the chip substrate 4, the back gold 6 is close to the lower surface of the chip substrate 4, and the equivalent heat sink 3 is fixed between the amplifier chip 2 and the constant temperature working surface 15 (70 degrees Celsius in this example) between. Such as figure 2 As shown, in the equivalent mo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a thermal simulation equivalent model of a PHEMT-based amplifier chip and a heat sink thereof. The model includes an equivalent model of the amplifier chip and an equivalent model of its heat sink. The equivalent model of the amplifier chip includes an equivalent PHEMT die, an equivalent layout, a chip substrate, metal vias, and back gold. Equivalent models for heat sinks include gold tin solder, pad pure copper, and base plate barium oxide. The equivalent PHEMT die is mainly based on the structure and heat distribution characteristics of each transistor, which is equivalent to a T-shaped gate with the same size as the gate of the transistor, a heat source under the T-shaped gate, and a gate finger with the same size as the entire stage. bullion. The invention realizes accurate simulation of the tube core thermal characteristics of the PHEMT-based amplifier chip in the whole general thermal analysis software, and can provide fast and effective reference data for the circuit design and thermal design of the whole chip.

Description

technical field [0001] The invention relates to a thermal simulation equivalent model of a PHEMT-based amplifier chip and its heat sink, which is especially suitable for research on the thermal characteristics of the amplifier chip. Background technique [0002] Amplifier chips based on gallium arsenide or gallium nitride pseudomate high electron mobility transistor technology play an important role in the field of modern radar and communication. With the continuous increase of power consumption and the continuous reduction of chip size, excessively high die channel temperature will directly affect the reliability and performance of chips and devices. Accurate detection of temperature is an extremely important part of engineering applications. The current direct measurement method of amplifier chip channel temperature is infrared thermal imaging technology. Infrared measurement technology is costly and time-consuming, and it cannot provide accurate die channel temperature ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/085H01L23/34
Inventor 徐秀琴王志宇尚永衡郭丽丽汪洋郁发新
Owner GREAT MICROWAVE TECH CO LTD