Light scattering measurement and image processing method and system for target
A technology of light scattering measurement and image processing, applied in the field of optics
Inactive Publication Date: 2015-09-09
王明军 +1
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[0003] The purpose of the present invention is to provide target light scattering measurement and image processing method, which solves the problem that there is no research on large object scale model research based on visible light scattering space target scale measurement.
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[0019] The present invention will be described in detail below in combination with specific embodiments.
[0020] Get the target to be tested figure 1 The visible light scattering intensity of the large object scale model 4 under different illumination conditions and different double station angles is used to establish a database of visible light scattering characteristics of the measured target; parallel light is generated by the solar simulator, irradiated on the measured target, and photoelectric detection is used The device is figure 1 The CCD detector 5 in the CCD acquires the grayscale image of the target, and integrates each pixel to obtain the grayscale value; all conditions remain unchanged, the measured target is replaced with a standard diffuse reflector with known reflectance, and the above steps are repeated. Measurement, compare the measured target at each position with the gray value of the standard diffuse reflection plate, and finally obtain the light scatter...
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The invention discloses a light scattering measurement and image processing method and system for a target. The method comprises the following steps: acquiring variable-bistatic-angle visible light scattering intensities of a to-be-measured target under different irradiation conditions; generating parallel light by using a solar simulator, then irradiating the to-be-measured target with the parallel light, acquiring a gray-level image of the target by using a photoelectric detector and carrying out integration on each pixel point so as to obtain a gray level value; under the condition that all the conditions are invariant, replacing the to-be-measured target with a standard diffuse reflection plate with known reflectivity and repeating the above-mentioned measurement operations; and comparing the gray level value of the to-be-measured target at each position with the gray level value of the standard diffuse reflection plate and eventually acquiring the light scattering cross-section value of the to-be-measured target relative to the standard diffuse reflection plate so as to calculate the visible light scattering intensity of the to-be-measured target. The light scattering measurement and image processing method and system provided by the invention can perfectly carry out visible light scattering-based model measurement and research on a space target in the field of research on a scale model of a large object.
Description
technical field [0001] The invention belongs to the field of optical technology, and relates to a target light scattering measurement and image processing method and system. Background technique [0002] In the 1970s, he began to systematically study the infrared characteristics of aircraft and other target models from the aspects of experiment and theory. In the 1980s, with the improvement of test technology in the fields of aerospace and national defense in my country, the measurement and research of the optical characteristics of aircraft, tanks and ships were carried out. Measurement technology based on visible light scattering characteristics started relatively late in China, and research in this area began in the late 1960s and 1970s. The national high-tech 863 expert group has successively established special research topics on space target and background characteristic measurement, optical scattering characteristic theoretical modeling and measurement, target visibl...
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Inventor 王明军李瑾苏比达董群锋
Owner 王明军