Method and system for automatically distinguishing qualified products from electronic components on large scale

Abstract

The invention discloses a method and a system for automatically distinguishing qualified products from electronic components on large scale. The method includes the steps of acquiring images of qualified electronic components or semi-finished electronic components, and storing them as standard images in an automatic optical tester; providing a PCB (printed circuit board) to be tested, including multiple finished or semi-finished ones of the electronic components, for the automatic optical tester; acquiring images of the finished or semi-finished ones of the electronic components on the PCB; subjecting the images of the finished or semi-finished ones of the electronic components to be detected, and the standard images to processing and comparing, and providing quality marks; generating Map information of the PCB; and transmitting and storing the Map information in a production actuator for following devices to read. By the use of the method and the system, the limitations such that manual inspection causes low productivity, high fallout ratio and high missing rate; thus, automatically distinguishing qualified ones from the electronic components on the large scale is realized.

Description

technical field [0001] The invention relates to the field of automatic production, and more specifically relates to a method and system for large-scale automatic identification of qualified products. Background technique [0002] In the manufacturing process of electronic components, because the electronic components themselves are relatively small, the manufacturing process is complicated, and the product quality requirements are high, the inspection of electronic components has become an indispensable part of the process of electronic component manufacturing. one of the steps. The basic method currently adopted is to manually use a microscope to inspect the finished or semi-finished electronic components one by one, manually use an oil pen to paint out the sub-point positions, and use manual selection to pick out defective products. [0003] However, the inventors have found that the above method has the following limitations: [0004] (1) In the process of using a micro...

AI Technical Summary

Problems solved by technology

[0004] (1) In the process of using a microscope to inspect individual finished or semi-finished electronic components one by one, the inspection items are limited due to the limited magnification of the microscope, which greatly increases the difficulty of inspection

[0005] (2) The use of manual inspection consumes a lot of manpower, has a high rate of false detection and missed detection, and greatly reduces production efficiency

[0006] (3) The process of using the oil pen to apply the points is very easy to cause secondary pollution to the product

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