A test circuit and test method for standard cell leakage current
A standard unit and test circuit technology, applied in the direction of measuring current/voltage, measuring device, measuring electrical variables, etc., can solve the problems of low efficiency and difficult leakage current testing, and achieve the effect of simple operation and easy operation
Active Publication Date: 2018-07-06
SEMICON MFG INT (SHANGHAI) CORP
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Problems solved by technology
[0008] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a test circuit and test method for the leakage current of a standard unit, which is used to solve the problems of difficulty in testing the leakage current and low efficiency.
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[0045] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0046] see Figure 1 to Figure 4 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...
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The present invention provides a test circuit and a test method for leakage current of a standard unit. The test circuit includes a plurality of basic unit structures connected in series. Each basic unit structure includes a drive circuit and a target unit circuit. There are many target unit circuit combinations a standard unit to be tested; the driving circuit is composed of a plurality of driving units, and is used to mount each of the standard units in the target unit circuit, so that the input of each standard unit in a steady state is consistent, so that The leakage current of the driving circuit is not greater than the leakage current of the target unit circuit. First test the total leakage current value of the test circuit composed of buffers and NAND gates; then replace the standard unit with a drive unit to test its total leakage current value; calculate the leakage current value of a single drive unit; finally calculate a single standard The leakage current value of the unit. The testing circuit and testing method of the standard unit leakage current of the present invention are simple and easy to operate, and can accurately and conveniently test the leakage current of the standard unit.
Description
technical field [0001] The invention relates to the field of integrated circuit performance testing, in particular to a testing circuit and testing method for standard unit leakage current. Background technique [0002] When designing integrated circuit chips with a process node of 0.18um and above (such as 0.35um), power consumption is a secondary factor considered in addition to speed and area. With the rapid development of integrated circuit technology, especially when entering the 65nm / 55nm process node, the number of transistors and the frequency of the clock are increasing rapidly, and the power consumption of the circuit is also increasing. Power consumption has become a major constraint on chip design. Factor is an important index to measure the performance of integrated circuits, and the power consumption problem has attracted more and more attention in the field of integrated circuit design. [0003] The power consumption of integrated circuits can be divided into...
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IPC IPC(8): G01R19/00
Inventor 鱼江华陈志强古力张凤娟郭响妮
Owner SEMICON MFG INT (SHANGHAI) CORP