Closed loop test system and closed loop test method of rapid switched capacitor automatic apparatus
A technology for switching capacitors and automatic devices, which is applied in measuring devices, general control systems, control/regulation systems, etc. It can solve the problems that the time scale cannot meet the fast switching capacitor banks, etc., and achieve reliable performance and flexible design.
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[0022] In order to make the purpose of the invention, the technical solution and its beneficial technical effects clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific implementations described in this specification are only for explaining the present invention, not for limiting the present invention.
[0023] see figure 1 The closed-loop test system of the fast switching capacitor automatic device of the present invention includes a simulation workstation 1 for establishing a grid model, a real-time digital simulator 2, an analog output interface card 3, a digital output interface card 4, a digital input interface card 5, and a power grid model. Flat isolation relay 6, voltage amplifier 7, switching capacitor automatic device 8, background monitoring 9, Ethernet 10, special debugging serial port line 11. Among them, the simulation workstation 1...
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