Wideband variable-temperature dielectric constant testing system for solid and powder materials

Abstract

The invention discloses a wideband variable-temperature dielectric constant testing system for solid and powder materials. The wideband variable-temperature dielectric constant testing system has the advantages that complex dielectric constants of the solid and powder materials can be tested on the basis of transmission and reflection methods under variable-temperature conditions; testing fixtures and Thru, Reflect and Line calibrating devices matched with the testing fixtures are designed, the testing fixtures, the Thru, Reflect and Line calibrating devices are used with temperature controllers, temperature sensors and heating rods during particular tests, and accordingly the complex dielectric constants of solid and powder can be tested under the wideband variable-temperature conditions.

Description

Technical field [0001] The invention belongs to the field of microwave technology, and more specifically, relates to a wide-band variable temperature dielectric constant test system for solid and powder materials. Background technique [0002] Circuits and electronic components are an important part of modern electronic information systems. Dielectric materials are an indispensable material in microwave components. Among them, an important parameter that characterizes electromagnetic characteristics-dielectric constant plays a role in the design of microwave components. Crucial role. In addition, the characteristic parameters of circuits and electronic components will change with the change of the dielectric constant, and the dielectric constant will also change with the change of frequency and temperature. Therefore, it is of great significance to understand the law of dielectric constant changing with frequency and temperature under the condition of wide frequency range and va...

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Problems solved by technology

Among them, the free space method is not suitable for the measurement of powder materials; the coaxial probe method has high requirements on the sample material, and the sample to be tested needs to be smooth and flat, and the probe should be in close contact with the material to be tested; the test accuracy of the multi-thickness and multi-state method Low; when the rectangular waveguide is used in the transmission-reflection method, it needs to be measured in divided frequency bands, and it needs to be calibrated after replacing the waveguide, which is cumbersome to operate

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