Bad block management system for satellite-based NAND FLASH solid memory

Abstract

The invention provides a bad block management system for a satellite-based NAND FLASH solid memory. The bad block management system comprises four groups of FLASH storage chips, a storage control FPGA (field programmable gate array), an EEPROM (electrically erasable programmable read-only memory) and a watchdog, wherein the four groups of FLASH storage chips are used for recording and playing back satellite payload detection data, and providing chip state feedback information and check information in solid memory erasing and writing processes; the storage control FPGA is used for controlling erasing, writing and reading operations of the FLASH storage chips, and interpreting whether the block is good or not according to the chip feedback information and the check information of the FLASH storage chips, so as to update a bad block list by the EEPROM; the EEPROM is used for storing bad block list information of the FLASH storage chips; and the watchdog is used for preventing a control signal end of the storage control FPGA from being in an unstable state to write wrong information into the EEPROM in the stand-alone electrifying and interruption processes. The bad block management system for the satellite-based NAND FLASH solid memory can be applied to a weather satellite data transmission sub-system; and according to a bad block management method, the accuracy and the integrality of satellite on-orbit remote sensing data are effectively ensured.

Description

technical field [0001] The invention relates to the field of satellite detection data access, in particular to the design of a satellite-borne NAND FLASH solid storage bad area management system. Background technique [0002] With the significant increase in the input rate of satellite loads, the demand for solid storage capacity has increased significantly, and the memory chips have been replaced by NAND FLASH series chips from SDRAM type. The memory capacity of the chip is 32Gbits. The newly adopted memory chip has the characteristics of high integration, the indicators meet the application requirements, the technology is relatively mature, and it has the experience of in-orbit flight verification. [0003] When used on a satellite, the storage module is composed of an ACTEL FPGA A54SX32A plus a NAND FLASH chipset, and uses (72, 64) Hamming check to enhance the anti-single event flipping capability of the FLASH storage board. One of the memory chips is used for EDAC verif...

AI Technical Summary

Problems solved by technology

However, due to the process structure of the NAND FLASH chip, some bad areas will appear during u

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