A Differential Interface Circuit Device Testing System
A technology for differential circuits and circuit devices, applied in the field of differential interface circuit device testing systems, can solve problems such as inability to test the functions of differential interface circuit devices and AC parameters, hidden quality problems, and inability to test differential DC parameters, so as to improve test capabilities, improve operation Reliable, practical results
Active Publication Date: 2018-01-30
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology
In the existing test methods, if the digital integrated circuit test platform is used for testing, the differential DC parameters such as common-mode voltage and differential-mode voltage cannot be tested, and corresponding hardware support and special test methods are required. Therefore, the differential interface circuit Usually tested on an analog integrated circuit test platform
However, in this test, due to the characteristics of the analog integrated circuit test platform, it is impossible to test the function and AC parameters of the differential interface circuit device. This is a major deficiency in the differential interface circuit test, which buryes quality risks for various types of tasks.
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[0029] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to specific embodiments and accompanying drawings.
[0030] According to an embodiment of the present invention, a differential interface circuit device testing system is provided.
[0031] like figure 1 As shown, the differential interface circuit device testing system provided according to the embodiment of the present invention includes:
[0032] Adapter 1, the adapter 1 is electrically connected to the differential circuit to be tested and the test platform 2, the adapter 1 provides a communication interface between the differential circuit to be tested and the test platform 2, and the adapter 1 is used for the differential circuit under the control of the test platform 2. Carry out peripheral tests, and feed back the peripheral test results to the test platform 2;
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The invention discloses a differential interface circuit device test system. The test system comprises an adapter electrically connected with a differential circuit to be detected and a test platform. The adapter provides a communication interface between the differential circuit to be detected and the test platform. The adapter is used for peripheral test of the differential circuit under control of the test platform, and feeds the peripheral test result back to the test platform. The test platform is electrically connected with the adapter. The test platform carries out functional test of the differential circuit through the adapter. The test platform is used for controlling the test platform to carry out peripheral test of the differential circuit, and carries out further analysis of the peripheral test result, and functional and parameter test results are obtained.
Description
technical field [0001] The invention relates to the field of chip testing, in particular, to a differential interface circuit device testing system. Background technique [0002] Differential interface circuit is an international general interface device used for signal transmission, such as RS485 bus control chip, low-voltage differential signal transceiver chip, and differential interface devices are widely used in electronic systems. As a signal transmission control chip within or between electronic systems, the quality of differential interface devices directly affects the quality and stability of electronic system signal transmission, thereby affecting the operation of the entire system. Therefore, the testing of differential interface devices is of great significance for ensuring the quality of the devices, ensuring the function and stability of signal transmission between electronic systems, and escorting important industries such as aerospace. [0003] Because of th...
Claims
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IPC IPC(8): G01R31/28
Inventor 李盛杰
Owner CASIC DEFENSE TECH RES & TEST CENT