A kind of lvdt sensor signal detection circuit and its detection method

Abstract

A LVDT sensor signal detection circuit and detection method thereof, the detection circuit includes a frequency generating circuit, the frequency generating circuit is connected to an LVDT sensor through an analog filter circuit and a driving circuit in sequence, and the secondary coil of the LVDT sensor is sequentially passed through an amplitude conditioning circuit and an A / D After converting the module, connect the envelope analysis module and the fault judgment module respectively. The detection method first outputs the sinusoidal 0 phase according to the primary coil, judges the phase of the secondary coil after a delay, records the time elapsed when the phase of the secondary coil is 0, and then makes the secondary coil of the LVDT sensor according to the recorded delay data. The coil performs signal collection, and the envelope analysis module and the fault judgment module respectively judge whether the signal amplitude, phase, and acceleration are within the normal range, and find out the fault location corresponding to different situations. The invention integrates detection and fault diagnosis, and has high diagnosis coverage and flexibility.

Description

technical field [0001] The invention belongs to the field of industrial control, and in particular relates to an LVDT sensor signal detection circuit and a detection method thereof. Background technique [0002] LVDT linear variable differential transformer is a common displacement sensor in industrial control systems, widely used in electric power, petrochemical, chemical and other industries. The problems existing in the existing LVDT sensor signal detection technology are as follows: [0003] 1. All current methods use analog methods, with complex circuits, low integration, low reliability, and difficult to reduce costs. [0004] 2. The current method cannot completely detect faults of LVDT signals, such as primary coil faults, circuit faults, etc. The reason is that the previous scheme uses analog to extract information, which cannot fully analyze the original signal, but only extracts useful information, while fault detection needs to use part of the information filte...

AI Technical Summary

Problems solved by technology

[0003] 1. All current methods use analog methods, with complex circuits, low integration, low reliability, and difficult cost reduction

[0004] 2. The current method cannot completely detect faults of LVDT signals, such as primary coil faults, circuit faults, etc.

The reason is that the previous scheme uses analog to extract information, which cannot fully analyze the original signal, but only extracts useful information, and fault detection needs to use part of the information filtered out by analog acquisition information, so fault judgment cannot be performed

[0005] 3. Poor adaptability, because it is implemented through an analog circuit, so when the characteristics of the external sensor change, circuit parameters need to be adjusted

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