Detector equipped with flexible film microwave strain PIN diode array

Abstract

Provided is a detector equipped with a flexible film microwave strain PIN diode array. The signal input end of the diode array is connected with a row driving signal. The signal output end of the diode array is connected with a column driving signal through analog signal processing units and an AD conversion unit. The diode array is formed by multiple strain diode units. Each strain diode unit is provided with a flexible first strain diode and a flexible second strain diode. One end of the first strain diode and one end of the second strain diode are connected with the source electrode of a first transistor and the source electrode of a second transistor, wherein the first transistor and the second transistor are used for controlling the on and off states of the strain diode unit. The other end of the first strain diode and the other end of the second strain diode are connected with a power supply. The gate electrode of the first transistor and the gate electrode of the second transistor are connected with the row driving signal. The drain electrode of the first transistor and the drain electrode of the second transistor are connected with the column driving signal successively through the analog signal processing units and the AD conversion unit. The L-shaped strain diode unit is formed by the first strain diode and the second strain diode. The detector may dynamically scan the three-dimensional characteristic of an object surface at high speed and high resolution.

Description

technical field [0001] The invention relates to a detector. In particular, it relates to a detector with a flexible thin film microwave strained PIN diode array. Background technique [0002] For example, when performing three-dimensional scanning on the surface of an object, we usually hope to obtain as large a detection area as possible to form an image that can be described, so that one detection can realize the acquisition of the three-dimensional characteristics of the entire object detection surface. At the same time, for the detection of the three-dimensional characteristics of the surface of the object undergoing high-speed deformation, we also hope that the detector can detect the change of the surface strain in real time and synchronously at high speed. The existing surface scanning technology is mainly laser three-dimensional surface scanning, but because laser scanning equipment requires an extremely high-precision working environment, complex optical calibratio...

AI Technical Summary

Problems solved by technology

The existing surface scanning technology is mainly laser three-dimensional surface scanning, but because laser scanning equipment requires an extremely high-precision working environment, complex optical calibration process and high equipment prices, laser three-dimensional surface scanning technology cannot fully meet the above requirements

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