Security test method and system based on chip

Abstract

The present invention is applicable to the field of chip testing, and provides a security test method and system based on a chip. The method comprises: controlling a radiation generating source by using a control device to generate at least two types of rays; collecting the at least two types of rays emitted by the radiation generating source by using a buncher; performing fault injection processing on a chip through the collected rays to enable the chip to undergo a bit-flipping and output data; performing cryptanalysis according to data outputted by the chip. If a password analyzed is the correct password, an algorithm used for chip encryption is required to be modified; and if the password analyzed is not the correct password, an encryption algorithm currently used for chip encryption is secure; Accordingly, the problem of chip security is solved from the perspective of fault injection attack defense and the chip can be used securely.

Description

technical field [0001] The invention belongs to the field of chip detection, in particular to a chip-based security detection method and system. Background technique [0002] At present, it is difficult to crack a certain mature encryption system purely from mathematics, but this does not mean that it is also difficult to crack a certain chip or a specific encryption algorithm. At present, there are three main attack methods used to crack chips: non-intrusive attack, semi-intrusive attack and intrusive attack; the use of radiation for error injection can be classified as non-intrusive attack. [0003] Fault injection attacks induce bit flips inside the chip, such as injecting electrons into the transistors by irradiating the transistors inside the chip to cause bit flips in the transistors; bit flips will bring the chip into an uncertain operating state, The introduction of wrong operation process leads to algorithm errors; and then the password can be cracked according to ...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a chip-based safety detection method and system, aiming to solve the problem of security risks in the prior art where only a single ray is injected into the chip by mistake

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