Multichannel scattering parameter testing circuit and method for complex modulation and phase coherence system

A scattering parameter measurement and phase coherence technology, applied in electrical components, digital transmission systems, data exchange networks, etc., to achieve the effect of small insertion loss

Inactive Publication Date: 2015-12-02
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
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Problems solved by technology

[0015] The present invention provides a multi-channel scattering parameter testing circuit and method suitable for complex modulation and phase coherence systems. It does not need to use a vector network analyzer, and can solve the multi-channel complex modulation and phase coherence mode for different practical applicatio...

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  • Multichannel scattering parameter testing circuit and method for complex modulation and phase coherence system

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Embodiment Construction

[0055] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0056] Such as figure 1 As shown, a multi-channel scattering parameter test circuit applicable to complex modulation and phase coherent systems of the present invention includes: a main control computer, a PXI chassis, a shared local oscillator signal generation unit, a shared clock reference generation unit, multi-channel complex modulation and Phase coherent excitation signal generation unit, multi-channel complex modulation and phase coherent excitation sig...

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Abstract

The invention provides a multichannel scattering parameter testing circuit and method for a complex modulation and phase coherence system. The multichannel scattering parameter testing circuit comprises a master control computer, a PXI cabinet, a shared local oscillator signal generating unit, a shared clock reference generation unit, a multichannel complex modulation and phase coherence excitation signal generating unit, a multichannel complex modulation and phase coherence excitation signal conditioning unit, a multichannel complex modulation and phase coherence excitation signal separating and reflection extraction unit, a multichannel complex modulation and phase coherence response signal separating and transmission extraction unit, a multichannel complex modulation and phase coherence response signal reception and conditioning unit and a multichannel complex modulation and phase coherence response testing and analyzing unit. During an actual test, the irregular influence factors such as long path and mismatching between a testing port and a testing calibration surface can be reduced or eliminated, and the expansion of signal separating and extraction technical characteristics can be realized through variable performance configuration.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a multi-channel scattering parameter testing circuit suitable for complex modulation and phase coherent systems, and also relates to a multi-channel scattering parameter testing method suitable for complex modulation and phase coherent systems. Background technique [0002] With the continuous and rapid development and application integration of microwave technology, microelectronics technology, and information technology, the functions of test objects (typically represented by microwave complex networks / components) are more abundant, and the technical composition and application status are more complex. The characteristic characterization (such as the accurate acquisition of scattering parameters) under corresponding complex conditions also presents a more urgent demand. Therefore, newer and higher technical requirements are put forward for testing technology or related products....

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Application Information

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IPC IPC(8): H04B17/391H04B17/309H04L12/26
Inventor 郭敏王尊峰关彬丁志钊周辉
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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