Line structured light based large section measurement method in complex light environment

Abstract

The invention discloses a line structured light based large section measurement method in a complex light environment. The method includes the steps of: extracting a structured light suspected region; eliminating a misidentification region in the structured light suspected region to obtain a preliminary identification region; conducting representative curve extraction on the basis of the preliminary identification region; transforming the pixel coordinate of the line structured light representative curve extracted from the image into an object coordinate; and fitting the coincident part linear form of the images where adjacent two sets of line structured light are located, and then conducting splicing fusion of multi-section curves. In a complex light environment, the method provided by the invention can intelligently eliminate the influence of enormous difference existing between complex environment light and measured object surface reflective medium, and accurately extract the measured line structured light profile curve. Under the circumstance of ensuring consistent accuracy, multiple line structured light is combined to measure fast large section profiles.

Description

technical field [0001] The invention relates to the technical field of object cross-section measurement, in particular to a method for measuring object cross-sections based on line structured light. Background technique [0002] In today's measurement field, there is a method for measuring the cross section of an object based on line structured light. Its core idea is to use line structured light to project onto the measured section, and then use the image unit to shoot the measured object at a certain angle and distance. According to the shooting results, image analysis is performed on the image data, and the representative curve of line structured light is extracted. Finally, the coordinates of the representative curve are converted according to the pre-calibrated parameters to obtain the coordinates of the object space of the measured section. The schematic diagram of the measurement principle is as follows figure 1 shown. This method is mainly used in various fields r...

AI Technical Summary

Problems solved by technology

[0005] 2. In the case of keeping the accuracy unchanged, that is, the ratio of the unit pixel to the actual object distance remains unchanged, the section measurement range is limited by the field of view of the image unit or the line length of the line structure light source itself, which cannot be applied to the measurement of some large sections

Although the measurement range can be increased by increasing the distance between the image unit, line structured light and the measured object, the measurement accuracy is also lost

[0006] 3. If the method of multiple splicing is adopted, under the dynamic movement environment, the fixed structure will be slightly deformed due to the external force, which will cause the relative position change (translation or rotation) of the measured section, and it will not be possible to form an effective measurement section

Images