Standard cell library function testing method with contrasting function

Abstract

The invention relates to a standard cell library function testing method with a contrasting function. An input vector selection and extension module, a standard unit module, a contrasting unit module, an address selection module, a first output vector selection module, a second output vector selection module and a contrasting judgment module are arranged. The input vector selection and extension module is used for receiving or generating an initial vector and conducting selection and extension on the initial vector; the standard unit module stores all units in a standard cell library in a sorted mode; the contrasting unit module stores all standard cell ideal models in a sorted mode; the address selection module is used for generating a testing address and achieving the control function on other modules; the first output vector selection module and the second output vector selection module are used for receiving model output results of the standard units and an ideal cell respectively; the contrasting judgment module is used for contrasting the ideal output result with the actual output result. According to the standard cell library function testing method with the contrasting function, parallel testing is conducted on the multiple standard cells through vector reuse, redundant vectors are reduced, and the testing rate is increased; when functions of the standard cells are tested, contrasting of the testing results is directly conducted through an ideal model, whether each unit accords with the requirement or not is judged, and the workload of a tester is reduced.

Description

technical field [0001] The invention relates to a function test method of a digital integrated circuit, which belongs to the field of digital integrated circuit verification, and in particular to a function test method of a standard unit library with a self-contained comparison function. Background technique [0002] With the rapid development of integrated circuit design and manufacturing, a single chip can integrate tens of millions of transistors. However, in order to meet more functional requirements, the integration level still needs to be continuously improved. Then, under the premise of ensuring that the chip area remains unchanged, the area of ​​each device unit must be continuously reduced, that is, the minimum size of each gate-level unit is continuously reduced. Every time the size is changed, a new standard cell library is bound to be generated. [0003] Standard cell libraries generally include two types of cells: combinational cells and sequential cells. Com...

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Problems solved by technology

Therefore, although this test method is simple and feasible, there are too many redundant vectors, the test efficiency is low, and the standard unit function cannot be automatically detected.

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