An automatic double-probe test platform based on a bitmap tracking method mainly comprises a base, a carrying table, a first probe support, a second probe support, a main control computer, a first driving mechanism and a camera, wherein the first driving mechanism drives the carrying table to rotate in the horizontal plane and to be lifted up, the camera is arranged above the carrying table, the shooting direction of the camera faces downwards, the carrying table can rotate, be lifted up and move in the Y-axis direction, and the first probe support and the second probe support can carry out horizontal movements and horizontal mirror symmetry movements in the same direction. According to the automatic double-probe test platform based on the bitmap tracking method, the automatic locating of double probes is achieved through a bitmap control technology, the automated locating tests of two testing points of a sample is achieved accordingly, the labor intensity of testing personnel is reduced greatly, and the testing accuracy is improved. The automatic double-probe test platform based on the bitmap tracking method is novel in locating mode, the rotating movable type carrying table and the movable symmetrical open type double probe supports are utilized ingeniously, the probes can be located at any two testing points of the sample to be tested, and the automatic double-probe test platform can meet testing demands.