208 results about "Double probe" patented technology

The invention belongs to the technical field of micro nanometer level detecting equipment, in particular to a double probe micro nanometer mechanics detecting system. A frame is installed in a bottom plate, the frame is provided with a precision one-dimensional platform and is adjusted by a button of the platform; one end of the precision one-dimensional platform is connected with a slide block, and a slide rail is installed below the slide block; the two sides of the slide rail are respectively provided with a piezoelectric ceramic; one end of a first probe fixing frame is installed on the frame and the other end is connected with a first probe, and a second probe fixing frame is installed on the frame and the other end is connected with a second probe; and the frame is provided with a first reflector, a second reflector, a laser, a PSD detector and a piezoelectric ceramic interface. The system can realize the detection of load, clamp, micro force and micro deformation, and can complete the micro nanometer mechanics experiment detection of the extension, the compression, the bend, the vibration, the fatigue, and the like, of material and structure, wherein sample size can be from micrometer to submicron degree, and the measurement range of the micro force is from nano Newton to micro Newton degree.

The invention discloses a method for quantitatively and qualitatively detecting root defects when the butt-jointed seam of the prior thick-wall (the thickness is more than 40mm) big-diameter tube can only be detected from a single side by adopting one-vertical one-horizontal high-frequency and narrow-pulse double probes based on a digital ultrasonic defect detector. For a thin-wall tube or tube on which the two-side detection is allowed, the digital ultrasonic wave based defect detector also can be used in reference. The horizontal wave inclined probe is moved, a main acoustic beam can generate the strongest diffracted waves when hitting the top part of the root defects such as crack, incomplete fusion, lack of fusion and the like or root shape defect aberration serious parts such as welding beading, inward depression, misaligned edges and the like, and the vertical wave straight probe on the welding seam receives the strongest diffracted waves; the horizontal wave inclined probe can read out the depths of top points of the defects, and the thickness of the wall of parent metal on the side of the inclined probe can be measured by moving the vertical wave straight probe; therefore, the quantitation on six types of typical root defects is realized; and simultaneously, by combining the quantitative data such as heights and horizontal positions of the defects, which is measured by a one-vertical one-horizontal double probe strongest diffracted wave method, with the characteristics of the diffracted waves generated when the horizontal wave inclined probe rotates to detect, the qualitation on the six types of typical root defects is completed, thereby solving the problem that the root defects are difficultly judged when the butt-jointed seam of the thick-wall big-diameter tube can only be detected from the single side.

The invention discloses a high-flux typed analyzing technique, material and agent box of nucleic acid based on stream-oriented cell tool-microcarrier gene chip, which is characterized by the following: augmentating promoter starting target to connect biotin; connecting magnet microparticle and fluorescent material on the nucleic acid probe; crossing with single-chain of target nucleic acid; separating and purifying target nucleic acid single-chain-probe; adopting high-polymolecule microparticle of clad biotin-proof protein as microcarrier; connecting target nucleic acid single-chain-probe; adopting double probe-sandwich method to test nucleic acid single-chain.

The invention discloses a home position micro area structure analyzing and nature detecting combination system, comprising transmission electron microscope and scanning probe microscope which includes electronics system and mechanical system. Mechanical system is installed in air tight air tight having the same size with probe (or sample), adjusting position of probe (or sample) in the space range can be observed, and the electronics system controls mechanical system working and processing signal detected. Combining advantages of transmission electron microscope and scanning probe, the system records atom structure of material microarea and physical property of home position real time, makes physical property of microarea have coincidence with microstructure, operates double probe of scanning probe microscope adjusts position of sample and does physical property measure, reentrancy again and location survey to separate nanometer structure.

The invention discloses a microstrip waveguide double-probe transition structure applicable to a millimeter-wave frequency multiplier. The structure includes an upper cavity, a lower cavity and a microstrip circuit. The lower cavity is covered with the upper cavity in a sealing way so that a rectangular waveguide cavity and a microstrip circuit shielding cavity are formed. The microstrip circuit is fixed in the microstrip-circuit shielding cavity. The microstrip circuit includes two microstrip probes, a power distribution/synthesis circuit and a dielectric substrate. The two microstrip probes and the power distribution / synthesis circuit are arranged on the same surface of the dielectric substrate. The two microstrip probes are connected with the two ends of the power distribution / synthesis circuit respectively. A distance between the center line of one microstrip probe and a rectangular-waveguide short-circuit face is 1/4 of a waveguide wavelength of an objective frequency and a distance between the center line of the other microstrip probe and the rectangular-waveguide short-circuit face is 5/4 of the waveguide wavelength of the objective frequency. The microstrip waveguide double-probe transition structure is capable of realizing same-phase superposition of an objective frequency signal and reversed-phase offset and output inhibition of a non-objective-frequency signal. The transition structure is simple in structure, convenient to manufacture and low in price.

The invention relates to a method for identifying gene mutation types in the field of gene analysis as well as a special chip and a kit thereof. The gene mutation detecting method comprises the following steps: taking a genome to be detected from a human tissue as a template, carrying out multiple allele special PCR amplification by a primer group that is designed aiming at special mutant sites and DNA polymerase without 3'-5' end exonclease activity, then hybridizing the obtained PCR product and an oligonucleotide probe (allele special probe) on the gene chip, and confirming mutation types of all gene sites according to the hybridizing result. The allele special probe is designed aiming at special gene types of gene mutant sites to be detected. The invention can detect gene mutations in comprehensive, systemic and high-flux ways and has light environmental pollution as well as simple and rapid operation compared with PCR-RFLP and a sequencing method.

The invention discloses a Langmuir multi-probe control circuit used for plasma diagnosis and belongs to the technical field of plasma diagnosis. The control circuit is located outside a plasma device and comprises three Langmuir single-probes, an alternating-current sawtooth wave supply voltage generation device, a direct-current supply voltage generation device, a double-pole-double-throw switch, a reversing switch, a first double-pole-three-throw switch, a second double-pole-three-throw switch, a first single-pole-single-throw switch, a second single-pole-single-throw switch and a transform resistor. Selection of the Langmuir single-probes, a double-probe, and a three-probe in different diagnosis circuits is carried out through switching-over of the switches in control circuits, and a cleaning circuit is provided for cleaning of the probes. According to the Langmuir multi-probe control circuit used for the plasma diagnosis, similarities of three probe diagnosis methods on an experimental instrument are used, experimental cost can be saved, different methods can be used by switching-over of the control circuits due to the fact that difference of the three probe diagnosis methods are combined, convenience and high efficiency are achieved, experimental period is greatly shortened, and experimental results are enabled to be accurate due to the fact that the probes can be cleaned during experiment.

The invention discloses a calibration method of a double-probe flying probe testing device. The method comprises the steps of obtaining a first coordinate of a fixed probe when the probe rotates for 0 degree from an original point of a rotating shaft thereof, a second coordinate while rotating for 90 degrees, and a third coordinate while rotating for 180 degrees; obtaining a fourth coordinate of a mobile probe when its distance to the fixed probe is an initial distance, and a fifth coordinate when its distance to the fixed probe is a preset distance; obtaining coordinates of a camera unit; obtaining the distance from the fixed probe to the camera unit when the distance between the fixed probe and the mobile probe is a first distance and the included angle between the connection line of the fixed probe and the mobile probe and the X axis is a first angle according to the first coordinate, the second coordinate, the third coordinate, the fourth coordinate, the fifth coordinate and the coordinate of the camera unit; and calibrating the double-probe flying probe testing device according to the distance from the fixed probe to the camera unit. Therefore, calibration of positions of double probes is achieved, and the condition that the double probes can accurately stab corresponding points on a tested circuit board is ensured.

The invention provides a millimeter wave ultra-wideband spatial power combining network. Radio-frequency signals are combined to a standard double-ridge-waveguide output port (1) from four micro-strip transmission line input ports (2). Micro-strip double probes (12) are vertically inserted in from a single-ridge-waveguide broadside (16) and are distributed on two sides of waveguide single ridges (19) in a face-to-face mode. Radio-frequency signals on micro-strip transmission lines (14) are transferred into non-standard single ridge waveguides (21), and the radio-frequency signals which are transferred into an upper non-standard single ridge waveguide and a lower non-standard single ridge waveguide are combined to a non-standard double-ridge-waveguide (20) through a T-joint (3). A two-stage impedance conversion step (10) is manufactured on the inner wall of a U-shaped slot bottom of a T-shaped outer layer (8). The non-standard double-ridge-waveguide is converted into a standard double-ridge-waveguide (6), and at the same time, the radio-frequency signals are transferred to the standard double-ridge-waveguide output port (1). The waveguide single ridges (19) of the upper non-standard single ridge waveguide and the lower non-standard single ridge waveguide are respectively turned, extend to pass through the non-standard double-ridge-waveguide and ultimately enter into the standard double-ridge-waveguide to form a double-ridge (17).

The invention is a semiconductor material property measurement device and method based on double probe beam for measuring the characteristic parameters of semiconductor materials and monitoring the doping process. It obtains the free carrier absorption signal and the light-modulated reflecting signal simultaneously in the same set of test system based on the absorption of the exciting light of the periodic intensity modulation by the semiconductor materials; it obtains the free carrier absorption signal and light-modulated reflecting signal of the frequency domain by changing the modulation frequency of the exciting light; it obtains the free carrier absorption signal and light-modulated reflecting signal of the spatial domain by changing the spacing between the exciting light and the probe light; it may obtain the characteristic parameters of semiconductor materials and the process parameters as the doping concentration through the analysis and processing of the signals obtained or the comparison with the signal data of the calibration sample. The invention makes up for the shortcomings of the single technology and improves the measurement accuracy; it obtains two kinds of signals simultaneously in one device and more important parameters of the semiconductor materials comparing with the single technology.

The invention discloses an ion source fast-connection scalable water-cooled Langmuir double probe comprising a probe core, a probe tube, a flange base, and a ceramic base. One end of the probe tube is brazed to the flange base, and cooling water inlet and outlet pipes are brazed to the end of the probe tube. The probe core and the ceramic base are welded together. The ceramic base is fixed to the probe tube in a threaded manner. The probe tube is internally provided with a cooling water tank which is communicated with the cooling water inlet and outlet pipes. Two teflon wires are arranged inside the probe tube. Two flange electrodes are sealed and fixed on the flange base through a clamping hoop and a sealing ring. One ends of the two flange electrodes extend into the probe tube to be respectively connected with the two teflon wires, and the other ends of the two teflon wires are connected with the probe core. The ion source Langmuir double probe of the invention meets the requirements of free length, convenient disassembly and self-cooling, and is simple in structure and convenient to install.

The invention discloses an optical microscopy-atomic force microscopy double-probe imaging method and an optical microscopy-atomic force microscopy double-probe imaging device. The device is provided with a scanner, an atomic force microscopy probe, an optical microscopy probe, a charge coupled device (CCD) detection probe, a data image acquisition system, a Z direction moving mechanism, an XY stepping moving mechanism and an open type large sample platform, wherein the scanner consists of a laser, a micro lens, single-pipe piezoelectric ceramics and a micro cantilever probe; the atomic force microscopy probe comprises a position sensitive detection unit, a photoelectric detection and feedback measurement control system and the like; and the optical microscopy probe consists of a micro objective group and a micro ocular group. An optical microscopy-atomic force microscopy double-probe system provided by the invention can simultaneously solve the problems of the observation of real-time optical microscopy in a wide range and the observation and the measurement of local high-resolution nano structures and performance.

The invention discloses a double-probe star sensor and a method for designing the same. The double-probe star sensor comprises two imaging probe modules, a central processing unit (CPU) data processing module and a power conversion module, wherein the two imaging probe modules are respectively connected with the CPU data processing module, interfaces adopt low voltage differential signaling (LVDS), the two LVDS interfaces are used to periodically time the two imaging probe modules, and the two imaging probe modules respectively and independently keep time within two timing periods. The method for designing the double-probe star sensor comprises: step 1, designing the power conversion module; step 2, designing the probe modules; and step 3, designing the data processing module. The double-probe star sensor is used for overcoming the defects of increased time difference between the two imaging probe modules and poor attitude precision of a rolling axis of the start sensor of the single imaging probe module after the star sensor operates for a long time; and even if a certain imaging probe module fails to work, on the basis of ensuring the attitude precision, the other imaging probe module still can output the attitude, so that the data reliability is improved.

The invention discloses a dual-probe reverse phase feeding microstrip antenna, which comprises a first medium substrate, a second medium substrate and a ground level, wherein the first medium substrate is parallel to the ground level; the second medium substrate penetrates through the ground level vertically; the upper end of the second medium substrate is adjacent to the lower surface of the first medium substrate; the first medium substrate is provided with a microstrip patch; a first L-shaped probe strip and a second L-shaped probe strip are arranged symmetrically on the second medium substrate; the first L-shaped probe strip is formed by connecting a first coupling exciting strip which is parallel to the ground level and a first feeding strip which is vertical to the ground level; the second medium substrate is partitioned into an upper area and a lower area by an intersection line between the second medium substrate and the ground level; an area of the second medium substrate, which is positioned on the lower side of the intersection line, is provided with a microstrip power divider in two penny; one path of the microstrip power divider is connected with the first feeding strip through an inverter; and the other path of the microstrip power divider is directly connected with the second feeding strip.

The invention discloses a double-probe same-point measurement scanning probe microscopy which uses an XY or XYZ piezoelectric scanner, and an XY or XYZ piezoelectric scanner which has an enhanced X location range or is additionally provided with XY inertia stepping to deliver a sample measuring point from a first probe to vicinity of a second probe, and realize re-measurement of the second probe to a first probe measurement point by looking for marks. Two independent Z-shaped localizers are used for adjusting the distance between the two probes and the sample, which causes each probe to not interfere the measurement of the other probe. Compared with the same-point measurement technologies of the existing mobile probes, the design is not provided with a degree of long-range freedom, the distance between the two probes is allowed to be longer, and different probes are also allowable, therefore, the control and the fabrication are greatly simplified, and given data are more comprehensive, reliable, significance is wider and deeper, and the scanning probe microscopy is especially suitable for the studies of phase change, reaction kinetics and interdiscipline.

The invention discloses a regular octagonal gradient magnetic field coil, which comprises two regular octagonal coils, wherein the axes of the two regular octagonal coils are coined, and the current directions of the two regular octagonal coils are opposite. A magnetic field with complete linear gradient is formed on the axes, so the coil can solve the problems that the processing difficultly of the coil is high when double-probe optical pumping type and proton type gradient magnetometers are used for calibrating the magnetic induction strength, and the coil is loosened after being used for a long time.

The invention discloses a laser force measuring system for a double-probe atomic force microscope, belongs to the technical field of the three-dimensional operation of nano-structures or nanometer devices, and particularly relates to the force measuring technology of atomic force microscope probes. The laser force measuring system aims to solve the problem that a traditional AFM cannot achieve the three-dimensional operation of the nano-structures due to the fact that the traditional AFM is not provided with a probe force measuring system. The laser force measuring system comprises two sets of independent laser mechanics subsystems, and the distribution of the independent laser mechanics subsystems corresponds to the distribution of two probes, and the independent laser mechanics subsystems are of a bilaterally symmetric structure. Two four-quadrant position detectors in the laser mechanics subsystems are respectively used for measuring the stress deformation degree of each probe, so that the nanoscale precision positioning of the positions of the two probes and the precise detection and control of operation force are achieved, and then the three-dimensional operation of the nano-sturctures is achieved. The laser force measuring system is suitable for the field of nana manufacturing, testing, characterization and biology.

An image locating control dual-probe automatic testing device based on midpoint tracking comprises a carrying table, two probe supports, a main control computer, a subdivision driver, a three-axis stepping motor and a camera. The subdivision driver drives a testing head assembly provided with the probe supports to rotate in the horizontal plane, the three-axis direction stepping motor drives the testing head assembly to move in the three-axis directions, the camera is arranged above the carrying table, the shooting direction of the camera faces downwards, and the testing head assembly is provided with a third driving mechanism driving the first probe support and the second probe support to carry out horizontal mirror image movements. According to the image locating control dual-probe automatic testing device based on the midpoint tracking, the automatic locating of dual probes is achieved by using image locating control technology to carrying out midpoint tracking of test points, the automatic locating testing of two test points of a sample is achieved, the labor intensity of testing personnel is reduced greatly, and the testing accuracy is improved. The locating mode is novel, the rotating type testing head assembly and the movable openable type dual probes are used ingeniously, the probes can be accurately located to any two test points of the sample to be tested, and thus the dual-probe automatic testing device can meet testing demands.

The invention relates to a strand substitute polymerase chain reaction, which is characterized in that a target gene chain to be detected is substituted by a probe containing reporter gene chain having a different sequence for indirect amplification, the probe sequence is complementary sequences selecting two small segments of conserved or specific sequences adjacent to target genes as double probes, different sequences of the reporter gene chain refers to a gene sequence which has minimum homology with the target gene chain or is in farther germ line, and the head and the tail of the reportergene chain are added with the given double-probe sequences to serve as linear band probe reporter genes. The target genes to be detected and the given head and tail probe sequences of the reporter genes are complementally hybridized so that the head and the tail of linear reporter genes are closed and linked, single-strand gaps of a hybrid are connected by ligase, and the target link is substituted by a reporter gene ring, namely a reverse PCR amplified reporter gene ring. By monitoring different sizes (at two ends) of reverse PCR amplification or the reporter genes with different codes, multi-target molecules can be indirectly indicated. More than one set of reporter genes can be alternately used.