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In-situ micro area structure analysis and property detection combined system

A technology of structural analysis and combined systems, applied in the field of combined systems, can solve problems such as the inability to manipulate a single nanostructure, and the inability to simultaneously obtain the atomic structure and property data of the same micro-region in situ

Active Publication Date: 2005-03-02
安徽泽攸科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current method cannot simultaneously obtain the atomic structure and property data of the same micro-region in situ, and the existing equipment cannot manipulate a single nanostructure. This is a bottleneck problem to be solved when experimental science enters the microscopic scale.

Method used

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  • In-situ micro area structure analysis and property detection combined system
  • In-situ micro area structure analysis and property detection combined system
  • In-situ micro area structure analysis and property detection combined system

Examples

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Embodiment Construction

[0028] As shown in FIG. 1 , the slider 1 is in the shape of a cuboid, and two pairs of shear crystals 2 are fixed on opposite sides of its outer surface.

[0029] Such as figure 2 As shown, the slider 1 is made of hard and light materials. The slider 1 is fixed in the clamping layer 3 by shearing the crystal 2, clamped with the clamping layer 3 and can slide along its inner wall. The tight sleeve layer 3 is a rectangular sleeve, and a thin gem piece is arranged between the inner wall of the clamping sleeve layer 3 and the shear crystal 2, which not only plays a good insulating role, but also is smooth and wear-resistant, and the shear crystal The area is larger than the area of ​​the gemstone to be bonded to it, so as to leave a space to paste the wire. Of course, the slider can also be made into a long strip with other cross-sectional shapes, such as a parallelogram in cross-section, as long as the bonded shear crystal The two opposite sides are parallel to each other and ca...

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Abstract

The invention discloses a home position micro area structure analyzing and nature detecting combination system, comprising transmission electron microscope and scanning probe microscope which includes electronics system and mechanical system. Mechanical system is installed in air tight air tight having the same size with probe (or sample), adjusting position of probe (or sample) in the space range can be observed, and the electronics system controls mechanical system working and processing signal detected. Combining advantages of transmission electron microscope and scanning probe, the system records atom structure of material microarea and physical property of home position real time, makes physical property of microarea have coincidence with microstructure, operates double probe of scanning probe microscope adjusts position of sample and does physical property measure, reentrancy again and location survey to separate nanometer structure.

Description

technical field [0001] The invention relates to a combined system capable of simultaneously testing the microstructure and properties of materials in situ. Background technique [0002] In the prior art, structural analysis and property testing are performed separately. High-resolution analytical electron microscopy is a powerful method for studying the microstructure of materials; the property testing of materials includes many aspects such as physical, chemical and mechanical properties, and scanning probe microscopy is a recently emerged method that can be used for micro-area property measurement and surface science research. instrument. The current method cannot simultaneously obtain the atomic structure and property data of the same micro-region in situ, and the existing equipment cannot manipulate a single nanostructure. This is a bottleneck problem to be solved when experimental science enters the microscopic scale. Contents of the invention [0003] In view of th...

Claims

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Application Information

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IPC IPC(8): G01N23/225G01N27/00G01Q60/02
Inventor 白雪冬王恩哥薛其坤王中林陈东敏
Owner 安徽泽攸科技有限公司
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