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Blade optical rapid measurement method based on double-probe four-axis measurement system

A measurement system and measurement method technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as difficulty in satisfying multi-angle and omni-directional three-dimensional scanning, inability to measure, etc., to solve the lack of point cloud data and improve measurement accuracy. , Measuring the effect of process automation

Inactive Publication Date: 2017-10-13
XIAN CHISHINE OPTOELECTRONICS TECH CO LTD
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AI Technical Summary

Problems solved by technology

[0003] However, it is difficult to meet the multi-angle and omni-directional three-dimensional scanning by using only a single laser displacement sensor.
Although the four-axis measuring machine has been equipped for industrial measurement, its movement method using the turntable as the fourth axis can only realize the 360° rotation of the workpiece in a single measurement plane, which is impossible for blades with measurement requirements on the upper and lower end surfaces. measure the full angle

Method used

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  • Blade optical rapid measurement method based on double-probe four-axis measurement system
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  • Blade optical rapid measurement method based on double-probe four-axis measurement system

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Embodiment Construction

[0018] The present invention or invention are described in further detail below in conjunction with accompanying drawing:

[0019] see figure 1 , a blade shape fast scanning method specifically includes the following steps:

[0020] In the first step, the initial model of the blade is used to calculate the surface point normal vector.

[0021] 1) Use the initial design model of the blade to sample points to obtain the point cloud data of the initial design model.

[0022] 2) Using the least squares plane fitting algorithm, the direction of the normal vector is calculated point by point for the above sampling points.

[0023] (1) First calculate each measuring point x i The K-nearest neighbors. At present, the common K-nearest neighbor calculation methods include spatial cell method, octree method and K-d tree method. In the present invention, the spatial cell method is adopted. Its algorithm principle is as follows.

[0024] let p = {p 1 ,p 2 ,...,p n} is a set of sa...

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Abstract

The invention discloses a blade optical rapid measurement method based on a double-probe four-axis measurement system. According to the method, two non-contact laser displacement sensors are combined on one same four-axis measurement system, in a respective work scope, measurement of a certain special scope of a blade is respectively realized, the measurement results of the two sensors are fused, complete angle three-dimensional point cloud data of an object is acquired, and precise measurement of the blade is lastly realized. The method is advantaged in that a mode of combination of the two non-contact laser measurement probes is employed to carry out three-dimensional measurement of the object, a problem of incomplete data caused by utilizing a single probe for measurement in the prior art is effectively solved, a problem of point cloud data loss of a certain point angle caused by fixed measurement orientation is solved, and measurement precision is improved.

Description

technical field [0001] The invention belongs to the field of advanced measurement technology, and relates to a blade optical fast scanning method, in particular to a method combining two non-contact laser displacement sensors. Background technique [0002] Optical measurement method is a popular advanced measurement method in the field of modern industrial inspection. For complex-shaped objects such as blades, the surface features are diverse and the surface curvature varies in a large range. Compared with the contact measurement method, the optical measurement method can quickly complete the measurement of the three-dimensional shape of the object in a short time. It has high measurement efficiency and a large amount of sampled data. It not only has outstanding achievements in the field of reverse engineering, but also provides high-precision data support for subsequent parameter analysis. [0003] However, it is difficult to satisfy multi-angle and omnidirectional three-d...

Claims

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Application Information

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IPC IPC(8): G01B11/24G01B11/00
CPCG01B11/002G01B11/24
Inventor 周翔高小飞许畅达
Owner XIAN CHISHINE OPTOELECTRONICS TECH CO LTD
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