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Optical bench for measuring focal length by magnification method

A technology of magnification method and optical bench, which is applied in the direction of testing optical performance, etc., can solve the problems of inability to meet high-precision measurement requirements, difficult to correct system errors, inconvenient measurement readings, etc. The effect of automatic reading

Active Publication Date: 2018-11-02
MOONLIGHT (NANJING) INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But this method also has some disadvantages
For example, the system error is difficult to correct, and it needs to match the objective lens according to experience, which cannot meet some high-precision measurement requirements, the measurement reading is inconvenient, and the human interpretation error is large

Method used

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  • Optical bench for measuring focal length by magnification method
  • Optical bench for measuring focal length by magnification method

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Embodiment Construction

[0017] Below in conjunction with specific embodiment, further illustrate the present invention, should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various equivalent forms of the present invention All modifications fall within the scope defined by the appended claims of the present application.

[0018] Such as figure 1 As shown, an optical bench for measuring the focal length by the magnification method disclosed in the embodiment of the present invention includes a collimator assembly 1, a lens holder 2, a measuring microscope 3, and a CCD receiver 4 arranged on the main optical axis in sequence. , the Y-axis one-dimensional guide rail 5 parallel to the main optical axis, and the X-axis one-dimensional guide rail 6 perpendicular to the main optical axis, and the X-axis one-dimensional gu...

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Abstract

The invention discloses an optical bench for measuring the focus length through a magnification method. The optical bench comprises a collimator assembly, a lens gripper and a measuring microscope which are sequentially arranged on a primary optical axis and a Y-axis one-dimensional guide rail parallel to the primary optical axis, and further comprises a CCD receiver and an X-axis one-dimensional guide rail perpendicular to the primary optical axis; the X-axis one-dimensional guide rail is provided with a sliding block, a lead screw for controlling the sliding block to move and a grating ruler for measuring the moving distance of the sliding block, and the measuring microscope is fixedly installed on the sliding block; the grating ruler is connected with a grating ruler data display instrument, and the CCD receiver is connected with an image display. According to the optical bench for measuring the focus length through the magnification method, by improving a traditional optical bench for measuring the focus length through the magnification method, the X-axis high-precision linear guide rail is additionally arranged, a double-image eyepiece is utilized for alignment, the focus length measuring error is decreased to 0.1%-0.5% from 0.5%-1%, and meanwhile the measuring range is widened and the measuring speed is increased.

Description

technical field [0001] The invention belongs to the technical field of optical instrument measurement, and in particular relates to a measuring device for measuring focal length by a magnification method. Background technique [0002] The characteristic parameters of the optical system are used as the basis for the design of optical instruments, and this characteristic parameter mainly determines the scope of application of the optical system. The focal length is an important characteristic of the optical system. As long as the focal length and the position of the focal point are known, all information such as the position, size, upside down, virtual reality, etc. of an object at any position that passes through the optical system can be completely determined. Therefore, preparing to measure the focal length of the optical system is not only a means to check and accept the product and assess whether it meets the design requirements, but also an important method to discover o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 张斌
Owner MOONLIGHT (NANJING) INSTR CO LTD