Signal processing circuit for radio comprehensive test instrument

A technology of signal processing circuit and comprehensive tester, applied in electrical components, transmission monitoring, transmission system and other directions, can solve problems such as inability to measure

Inactive Publication Date: 2016-02-10
CHNEGDU CHIFFO ELECTRONICS INSTR
View PDF8 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problem that multiple functions cannot be measured on the same instrument, the present invention provides a signal processing circuit for a radio comprehensive tester

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Signal processing circuit for radio comprehensive test instrument
  • Signal processing circuit for radio comprehensive test instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] According to the attached figure 1 , attached figure 2 A brief description is given of the specific embodiments of the present invention.

[0018] A signal processing circuit for a radio comprehensive tester, comprising a control module 1 (specifically using an ICETEK-OMAPL138-KB chip), an intermediate frequency generation module 3, an intermediate frequency measurement module 2, an audio generation module 5, and an audio measurement module 4;

[0019] Described intermediate frequency generation module 3 is connected with described control module 1 by SPI bus, and it is used to generate the intermediate frequency of designated frequency according to the order of control module 1 and output; In the present embodiment, intermediate frequency generation module 3 adopts the single-chip DDS of Maxim Corporation chip and its peripheral circuits; the main peripheral circuits of the DDS chip include reference signal source, control, loop filter and output low-pass filter, etc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a signal processing circuit for a radio comprehensive test instrument. The signal processing circuit comprises a control module, an intermediate frequency generating module, an intermediate frequency measuring module, an audio generating module and an audio measuring module; the intermediate frequency generating module is connected with the control module by virtue of an SPI bus and used for generating an intermediate frequency of a specific frequency and outputting the generated intermediate frequency according to an order of the control module; the intermediate frequency measuring module is connected with the control module by virtue of an EMIF bus and used for digitally sampling and analyzing the received intermediate frequency signal by virtue of a digital sampling way; the audio generating module is connected with the control module by virtue of the SPI bus and used for synthesizing an audio of a specific frequency and outputting the synthesized audio according to the order of the control module; the audio measuring module is connected with the control module by virtue of the EMIF bus and used for sampling and analyzing the received audio signal. By adopting the signal processing circuit, the integration of various measuring functions is realized, so that the comprehensive test instrument comprising the circuit can be used for measuring various radio signals.

Description

technical field [0001] The invention relates to an electronic measuring instrument, in particular to a signal processing circuit for a radio comprehensive tester. Background technique [0002] At present, a single test is used for on-site test instruments of communication devices. One instrument can only measure a few functions, and cannot realize the measurement of multiple functions. Correspondingly, the signal processing circuit part of the existing test instruments can only measure individual functions. analyze. Contents of the invention [0003] In order to solve the problem that multiple functions cannot be measured on the same instrument, the present invention provides a signal processing circuit for a radio comprehensive tester. [0004] In order to solve the problems of the technologies described above, the present invention provides the following technical solutions: [0005] A signal processing circuit for a radio comprehensive tester, including a control modu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00
Inventor 何华章刘克农
Owner CHNEGDU CHIFFO ELECTRONICS INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products