Double helix electrode capacitance tomography sensor for measuring annular space

A capacitance tomography, double-spiral electrode technology, applied in the measurement device, material capacitance, material analysis by electromagnetic means, etc., can solve the problems of complexity, many influencing factors, difficult arrangement and installation of sensors, etc., to achieve fast real-time, Variety of heat transfer methods and the effect of improving axial resolution

Inactive Publication Date: 2016-02-24
NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

The flow field, temperature field, and concentration field in the annular space are very complex, with many influencing factors, and the sensor is difficult to arrange and install, and the detection signal is very weak due to being blocked

Method used

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  • Double helix electrode capacitance tomography sensor for measuring annular space
  • Double helix electrode capacitance tomography sensor for measuring annular space
  • Double helix electrode capacitance tomography sensor for measuring annular space

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Embodiment Construction

[0020] The present invention proposes a double-helix electrode capacitance tomography sensor for measuring the annular space. Using the electrode sensor parts arranged spirally on the inner and outer tube walls, the three-dimensional imaging of the measured annular space is truly realized. The double-helix electrode for detecting the annular space The structural capacitance tomography sensor includes a main structure part and a capacitance measurement part; the present invention will be further described below in conjunction with the accompanying drawings.

[0021] like figure 1 shown. The sensor includes a main structure part and a capacitance measuring part. The main structure part is composed of a concentric inner pipe (insulation) 1, an outer pipe (insulation) 2 and a fixed connection bracket 11, and the annular space 12 between the two layers of pipes is the space to be measured. The capacitance measurement part includes an inner tube detection electrode 7, an outer tub...

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Abstract

The invention discloses a double helix electrode capacitance tomography sensor for measuring an annular space that belongs to the field of an electrical process tomography device. The sensor comprises a main structure part and a capacitance measurement part. The main structure part is composed of concentric inner and outer tubes and a connection bracket used for fixing position. An annular space between the inner and outer tubes is a measured space. The capacitance measurement part comprises detection electrodes, electrode end shields, shielding cases, a signal transmission cable, ECT signal acquisition equipment and connection wires. By the utilization of electrode sensor parts which are respectively spirally arranged on the inner and outer tube walls, three-dimensional imaging of the measured annular space is truly realized. Due to the sensor structure with electrodes uniformly distributed on the two tube walls, imaging of the annular space is realized, and the problem of weak capacitance signal is also improved. The invention is a big breakthrough of the ECT technology.

Description

technical field [0001] The invention is an electrical process imaging device, which is a double-helix electrode capacitance tomography sensor for measuring the annular space. Background technique [0002] Electrical Capacitance Tomography (ECT) is a multiphase flow parameter detection technology developed in the mid-1980s. ECT technology is based on the capacitance sensitive mechanism. When the shape and distribution of the multiphase flow medium in the measured area changes, it will cause the capacitance value between the detection capacitor plates to change, so as to reconstruct the multiphase flow in the measured area through the reconstruction algorithm. distribution image. [0003] The source of the capacitance of the ECT system is the sensor. The traditional ECT sensor is mostly a two-dimensional sensor structure arranged in a single layer, generally an array structure of 8, 12, and 16 electrodes. These electrodes are only arranged around the same height, with the sam...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/22
CPCG01N27/221
Inventor 周琬婷姜越刘石刘婧
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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