Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment

An electronic equipment, overcurrent technology, applied in the direction of emergency protection circuit devices, electrical components, circuit devices used to limit overcurrent/overvoltage, etc., can solve problems such as burning out chips, and achieve the effect of preventing damage

Inactive Publication Date: 2016-02-24
PHICOMM (SHANGHAI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of the present invention is to provide an improved method and system for preventing overcurrent and overvoltage damage in electronic equipment testing, so as to completely solve the problem of burning chips due to overcurrent and overvoltage during production line testing

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  • Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment
  • Method and system for preventing overcurrent and overvoltage damages in test of electronic equipment

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Embodiment Construction

[0023] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention, and in the absence of conflict, the present invention The embodiments and the features in the embodiments can be combined with each other.

[0024] figure 2 A schematic structural diagram of a system 200 for preventing overcurrent and overvoltage damage during testing of an electronic device (eg, a mobile phone) provided by an embodiment of the present invention. Such as figure 2 As shown, an overcurrent and overvoltage protection circuit 206 is connected in series between the positive pole of the test fixture 202 and the positive pole of the power supply 204 . combine the following image 3 From this point of view, the overcurrent and overvoltage protection circ...

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PUM

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Abstract

The invention discloses a method and system for preventing overcurrent and overvoltage damages in test of electronic equipment. The method comprises the following steps: connecting an overcurrent overvoltage protective circuit in series between a test fixture and a power supply; connecting the test fixture to the to-be-tested electronic equipment; when current passing through the overcurrent overvoltage protective circuit is increased to a current threshold, automatically disconnecting the test fixture from the power supply; and when voltage input in the overcurrent overvoltage protective circuit is increased to a voltage threshold, clamping and outputting a stable output voltage value. With adoption of the method and system for preventing overcurrent and overvoltage damages in test of electronic equipment, when current passing through the test fixture from the power supply is increased to the set current threshold, the current connectivity can be cut off automatically, and the voltage input from the power supply to the test fixture is limited to be stable working voltage, thereby solving the overcurrent and overvoltage problems during a test and preventing damage to internal parts of the electronic equipment.

Description

technical field [0001] The invention relates to the field of electronic equipment testing, in particular to a method and system for preventing overcurrent and overvoltage damage in electronic equipment testing. Background technique [0002] In the testing of existing electronic equipment (such as mobile phones, tablet computers, etc.), there is no device for over-current and over-voltage protection between the test fixture and the power supply, so in actual testing, it is very easy to cause accidents due to Conditions (such as misoperation, short circuit, voltage, etc.) lead to overcurrent or overvoltage, thereby damaging the device under test connected to the test fixture. [0003] figure 1 It is a schematic structural diagram of a system 100 for preventing overcurrent damage during testing of electronic devices (eg, mobile phones) according to the prior art. Such as figure 1 As shown, an overcurrent protection element 106 is connected in series between the positive pole...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02H7/20H02H3/087H02H9/04
CPCH02H7/20H02H3/087H02H9/042
Inventor 申圣军
Owner PHICOMM (SHANGHAI) CO LTD
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