Interference device and spectrometer comprising same

A technology of spectrometer and light beam, which is applied in the field of spectrometer, can solve the problem that the inclination of the plane mirror cannot be corrected, etc.

Inactive Publication Date: 2016-03-09
BEIJING SDL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The invention provides an interference device, which can solve the problem that the inclination of the plane mirror of the interferometer cannot be corrected in the prior art, and thus can avoid the problem of non-collimation

Method used

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  • Interference device and spectrometer comprising same
  • Interference device and spectrometer comprising same
  • Interference device and spectrometer comprising same

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Embodiment Construction

[0029] This specific embodiment provides an interference device, which can solve the problem that the inclination of the plane mirror of the interferometer cannot be corrected in the prior art, and thus can avoid the problem of non-collimation. The specific embodiment also provides a spectrometer including the above-mentioned interference device.

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] Please refer to Figure 2-Figure 6 , the interference device provided in this specific embo...

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Abstract

The invention discloses an interference device and a spectrometer comprising the interference device. The interference device comprises a housing, a swing arm, a first solid angle mirror, a second solid angle mirror and a beam-splitter mirror, wherein the swing arm is swingably arranged to the housing through a pivot, and the swing arm comprises a first arm portion and a second arm portion, which are fixedly together; the first solid angle mirror is arranged to the first arm portion; the second solid angle mirror is arranged to the second arm portion; and the beam-splitter mirror is arranged between the first solid angle mirror and the second solid angle mirror, and splits the light rays into a first light beam and a second light beam, the first light beam being irradiated to the first solid angle mirror, and the second light beam being irradiated to the second solid angle mirror to enable the reflected first light beam and the second light beam to have interference. The interference device having the structure above can solve the problem that inclination of a plane mirror of an interferometer in the prior art cannot be corrected, and the problem of no-collimation can be prevented.

Description

technical field [0001] The invention relates to the technical field of spectrometers, in particular to an interference device and a spectrometer including the interference device. Background technique [0002] The Fourier infrared spectrometer can use the transformation relationship between the infrared interference signal and the infrared spectrogram to obtain the information of the infrared spectrum of the material through the collection of the infrared interference signal, so as to qualitatively or quantitatively analyze the composition and content of the material. The infrared interferometer is the heart component of the Fourier infrared spectrometer, the modulation efficiency of the interferometer, the stability of the moving mirror scanning mechanism and other issues are the core issues of the Fourier infrared spectrometer. [0003] Please refer to figure 1 , figure 1 It is a structural principle diagram of an interferometer in the prior art. This type of interferom...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
CPCG01J3/45
Inventor 敖小强石磊
Owner BEIJING SDL TECH
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