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Device and method for withstand voltage test of induction cooker IGBT

A test device and withstand voltage test technology, which is applied in the direction of measuring devices, testing dielectric strength, and components of electrical measuring instruments, etc., can solve problems such as IGBT breakdown damage, voltage increase, and LC circuit oscillation

Active Publication Date: 2016-04-13
JIANGSU CAS IGBT TECHNOLOGY CO LTD
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Problems solved by technology

During the working process of the induction cooker, if the voltage fluctuation of the power supply grid occurs, it will cause the LC circuit to oscillate. When the LC circuit oscillates, the voltage across the collector c and emitter e of the IGBT will increase instantaneously, which may cause the breakdown of the IGBT. damage

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  • Device and method for withstand voltage test of induction cooker IGBT
  • Device and method for withstand voltage test of induction cooker IGBT
  • Device and method for withstand voltage test of induction cooker IGBT

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0029] In order to test the withstand voltage performance of the induction cooker IGBT to be tested, it is necessary to provide a pulse voltage for the induction cooker. The existing test method is to provide a pulse voltage for the induction cooker through a surge tester, and use an oscilloscope to test the voltage at both ends of the collector and emitter of the IGBT. , to detect the withstand voltage performance of the IGBT. However, the cost of surge testi...

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Abstract

The invention discloses a device and a method for withstand voltage tests of induction cooker IGBTs. The test device comprises a voltage fluctuation device and an oscilloscope. The voltage fluctuation device comprises a test capacitor and a control switch. A first plate of the test capacitor is connected with an input electrode of a to-be-tested induction cooker through the control switch. A second plate of the test capacitor is connected with another input electrode of the to-be-tested induction cooker. A first input end of the oscilloscope is connected with the collector electrode of an IGBT. A second input end of the oscilloscope is connected with the emitting electrode of the IGBT. The oscilloscope is used to test voltage between the emitting electrode and the collector electrode of the IGBT. The test device and the method can simulate voltage fluctuation of a power supply network, and provide pulse test voltage for the IGBT of the to-be-tested induction cooker, so as to realize withstand voltage tests of the IGBT.

Description

technical field [0001] The invention relates to the technical field of semiconductor device testing, and more specifically, relates to a withstand voltage testing device and method of an induction cooker IGBT. Background technique [0002] Insulated Gate Bipolar Transistor (Insulated Gate Bipolar Transistor, referred to as IGBT) is a composite fully-controlled voltage-driven power semiconductor device composed of a bipolar transistor (BJT) and an insulated gate field effect transistor (MOSFET). The advantages of the input impedance and the high-speed switching characteristics of the power transistor (Giant Transistor, GTR for short), therefore, the IGBT as an important switching device is widely used in various switching circuit structures. [0003] An important application of IGBT is used as a switch tube in the control circuit of an induction cooker. refer to figure 1 , figure 1 It is a circuit diagram of the control circuit of the induction cooker 1, including: LC loop...

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Application Information

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IPC IPC(8): G01R31/12G01R1/28
Inventor 罗金胡少伟黎奇
Owner JIANGSU CAS IGBT TECHNOLOGY CO LTD
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