Check patentability & draft patents in minutes with Patsnap Eureka AI!

A kind of withstand voltage test device and method of induction cooker IGBT

A testing device and withstand voltage testing technology, which is applied in measuring devices, testing dielectric strength, components of electrical measuring instruments, etc., can solve problems such as LC circuit oscillation, IGBT breakdown damage, and voltage increase

Active Publication Date: 2019-01-15
JIANGSU CAS IGBT TECHNOLOGY CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the working process of the induction cooker, if the voltage fluctuation of the power supply grid occurs, it will cause the LC circuit to oscillate. When the LC circuit oscillates, the voltage across the collector c and emitter e of the IGBT will increase instantaneously, which may cause the breakdown of the IGBT. damage

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of withstand voltage test device and method of induction cooker IGBT
  • A kind of withstand voltage test device and method of induction cooker IGBT
  • A kind of withstand voltage test device and method of induction cooker IGBT

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0029] In order to test the withstand voltage performance of the IGBT of the induction cooker to be tested, it is necessary to provide a pulse voltage for the induction cooker. The existing test method is to provide a pulse voltage for the induction cooker through a surge tester, and test the voltage across the collector and the emitter of the IGBT through an oscilloscope. , in order to test the withstand voltage performance of the IGB...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device and a method for withstand voltage tests of induction cooker IGBTs. The test device comprises a voltage fluctuation device and an oscilloscope. The voltage fluctuation device comprises a test capacitor and a control switch. A first plate of the test capacitor is connected with an input electrode of a to-be-tested induction cooker through the control switch. A second plate of the test capacitor is connected with another input electrode of the to-be-tested induction cooker. A first input end of the oscilloscope is connected with the collector electrode of an IGBT. A second input end of the oscilloscope is connected with the emitting electrode of the IGBT. The oscilloscope is used to test voltage between the emitting electrode and the collector electrode of the IGBT. The test device and the method can simulate voltage fluctuation of a power supply network, and provide pulse test voltage for the IGBT of the to-be-tested induction cooker, so as to realize withstand voltage tests of the IGBT.

Description

technical field [0001] The invention relates to the technical field of semiconductor device testing, and more particularly, to a device and method for withstand voltage testing of an IGBT of an induction cooker. Background technique [0002] Insulated Gate Bipolar Transistor (IGBT) is a composite fully controlled voltage-driven power semiconductor device composed of a bipolar transistor (BJT) and an insulated gate field effect transistor (MOSFET). Due to the advantages of the high input impedance of the device and the high-speed switching characteristics of the power transistor (ie, giant transistor, GTR for short), IGBT, as an important switching device, is widely used in various switching circuit structures. [0003] An important application of IGBT is as a switch tube in the control circuit of an induction cooker. refer to figure 1 , figure 1 It is a circuit diagram of the control circuit of the induction cooker 1, including: an LC loop, a filter capacitor C2, a switch...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12G01R1/28
Inventor 罗金胡少伟黎奇
Owner JIANGSU CAS IGBT TECHNOLOGY CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com