AFDX photoelectric conversion time delay test method

A technology for photoelectric conversion and time delay testing, which is applied to electrical components, data exchange networks, transmission monitoring, etc., can solve the problems of inability to accurately measure the photoelectric conversion time delay of AFDX photoelectric converters, and meet the test requirements, high test accuracy, The effect of accurate test results

Inactive Publication Date: 2016-04-20
XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
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Problems solved by technology

Normally, the photoelectric conversion delay of AFDX photoelectric converter is less than 1us, but the accuracy of ordinary AFDX network test equipment is us level, and it is impossible to accurately measure the photoelectric conversion delay of AFDX photoelectric converter

Method used

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  • AFDX photoelectric conversion time delay test method
  • AFDX photoelectric conversion time delay test method
  • AFDX photoelectric conversion time delay test method

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Embodiment Construction

[0028] The invention proposes an AFDX photoelectric conversion time delay testing method. The AFDX photoelectric conversion time delay testing device uses an AFDX end system, and the end system has two electrical interfaces, one for outputting AFDX data frames and one for receiving AFDX data frames. The physical layer circuit of the AFDX end system is composed of a PHY chip. The time delay between the sending data of the PHY chip and the sending enable signal TX_EN, and the time delay between receiving data and receiving the effective signal RX_DV are basically fixed. Therefore, the test sending data and The time delay of receiving data can be converted into a time delay test between testing the sending enable signal TX_EN and receiving the valid signal RX_DV. In the test device, the transmit enable signal TX_EN and the receive valid signal RX_DV are led to the panel through cables. In the test, firstly, the two electrical interfaces of the AFDX end system are looped back thro...

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Abstract

The invention belongs to the technology of airborne network test, and discloses an AFDX (Avionics Full Duplex Switched Ethernet) photoelectric conversion time delay test method. According to the method, an AFDX end system is used as a test apparatus, the test of AFDX photoelectric conversion time delay is converted into a test of time delay between transmitting an enable signal TX_EN and receiving a useful signal RF_DV by the AFDX end system, test of photoelectric conversion time delay of ns grade is realized, and consequently, high-precision test of the AFDX photoelectric conversion time delay is realized.

Description

technical field [0001] The invention is used in the field of airborne network testing and relates to a testing method for the conversion time delay of an AFDX photoelectric converter. Background technique [0002] Avionics full-duplex switched Ethernet (AFDX) is a real-time, deterministic full-duplex switched Ethernet, which is currently internationally recognized as the mainstream airborne network of transport aircraft. Based on the current development status, in the airborne AFDX network, optical fiber has not completely replaced traditional media such as coaxial cables and twisted pairs, so AFDX photoelectric converters are required to provide photoelectric conversion for coaxial cables and optical fibers. [0003] Network delay is a very important performance indicator of the AFDX network. When designing the AFDX network and distributing data streams, the delay characteristics of the network system must be considered to ensure that the data streams are transmitted within...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26
CPCH04B17/00
Inventor 白杨孔维刚张旭陈长胜何向栋
Owner XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
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