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A method for detecting the yield rate of raid card memory particles by sending specific test data

A technology of memory particles and test data, applied in static memory, instruments, etc., can solve the problems of not being able to cover the underlying particles, insufficient delay, single delivery detection method, etc., achieve good use value, easy processing, and simple and convenient processing and production Effect

Active Publication Date: 2019-09-06
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The factory’s delivery inspection method is single, and the Raid card can only be tested by using the pressure software of Yes+DD under the operating system, but it cannot cover the problems of the underlying particles
[0004] Through the analysis and investigation of the faulty Raid card, it is confirmed that Nanya memory particles have insufficient delay in the processing of the relationship between Data signal and Clock signal Timing

Method used

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Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0017] A method for detecting the yield rate of RAID card memory particles by sending specific test data according to the present invention will be described in detail below.

[0018] A method for detecting the yield rate of RAID card memory particles by sending specific test data of the present invention is characterized in that it first analyzes the cause of the error report of the RAID card memory, finds the fault point, and secondly develops the test software to strengthen the data for the fault cause. Packet sending, check the accuracy of memory verification data, and screen the yield rate of memory particles;

[0019] Specific methods include:

[0020] (1) Check the Clock and Data transmission mechanism of the memory granule, and clarify the reason why the memory granule reports an error;

[0021] (2) Use the software to send and receive packets to the memory to check the accuracy of memory processing data.

[0022] The invention proposes a method for detecting the yie...

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PUM

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Abstract

The present invention provides a method for detecting the yield rate of RAID card memory particles by sending specific test data. First, analyze the cause of the error report of the RAID card memory to find the fault point. Check the correct rate of memory verification data, and screen the yield rate of memory particles; compared with the prior art, a method of detecting the yield rate of RAID card memory particles by sending specific test data of the present invention, through the memory particle DDR bus, with the help of ECC Function, compare the sent data & received data to confirm the degree of particle defect. It has the characteristics of reasonable design, simple structure, easy processing, convenient use, etc., so it has good use value.

Description

technical field [0001] The invention relates to the field of computer server component testing, in particular to a method for detecting the yield rate of RAID card memory particles by sending specific test data. Background technique [0002] Recently, a certain Raid card product is used in the market, and a Signal ECC Error error occurs during the normal operation of multiple server products. After the error is reported by the Raid card, the system will be shut down. [0003] When a Signal ECC Error occurs on this Raid card, it occurs only after a long period of use, and errors will be reported probabilistically only after a period of use. The factory's delivery inspection method is single. It can only use the Yes+DD pressurization software to perform a pressurization test on the Raid card under the operating system, but it cannot cover the underlying particle problems. [0004] Through the analysis and investigation of the faulty Raid card, it is confirmed that the Nanya m...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/42G11C29/44
Inventor 张锋
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD