Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A kind of array substrate and its preparation method and display device

An array substrate and display area technology, which is applied in semiconductor/solid-state device manufacturing, instrumentation, semiconductor/solid-state device testing/measurement, etc., can solve problems such as increased space occupied by test components, scattered distribution of test components, and reduced test efficiency. Achieve the effects of improving timeliness, saving space, and reducing process testing costs

Active Publication Date: 2019-01-22
BOE TECH GRP CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The existing test unit is to design multiple test elements on different layers in the non-display area. Among these test elements, they are used to test the line width of the signal line, the overlap between the upper and lower conductive film layers, and the long channel and short channel. The test elements of the transistor characteristics of the channel are set independently, and the distribution of the test elements in the non-display area is scattered, which not only increases the occupied space of the test elements in the non-display area, which is not conducive to saving the preparation cost, but also in the When testing different process parameters, it is necessary to frequently move the test equipment (such as optical test equipment and electrical test equipment), which greatly reduces the test efficiency and increases the test cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of array substrate and its preparation method and display device
  • A kind of array substrate and its preparation method and display device
  • A kind of array substrate and its preparation method and display device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0053] This embodiment provides an array substrate, such as figure 1 with figure 2 As shown, it includes a multi-layer pattern layer arranged in the display area and a test unit 1 arranged in a non-display area. The test unit 1 includes at least one test assembly 10 and a test transistor 13. The test assembly 10 includes a test block pattern 11 and a test line. Graphic 12; test block graphics 11 and one layer of the multi-layer pattern layer are arranged on the same layer, and one layer of the test line pattern 12 is set on the same layer as the multi-layer pattern layer, and the test block pattern 11 and the test line pattern 12 are different layers, The orthographic projection of the test line pattern 12 on the array substrate corresponds to the periphery of the orthographic projection of the test block pattern 11 on the array substrate; the test block pattern 11 is connected to the test transistor 13 .

[0054] In this embodiment, the orthographic projection of the test l...

Embodiment 2

[0086] This embodiment provides an array substrate. The difference from Embodiment 1 is that the test unit in this embodiment only includes one test component, and the test component can be the first test component, the second test component, the second test component, The third test component or the fourth test component; it can also be other test components similar to the first test component, the second test component, the third test component or the fourth test component in the arrangement.

[0087] In this embodiment, the test unit may or may not include a test transistor. The gate, source and drain of the test transistor can be connected to different test block patterns or test line patterns respectively, and the test signal is sent from the test block pattern or test line pattern; they can also not be connected to the test block pattern or test line pattern , directly sent to the test signal by the external test equipment.

[0088] It should be noted that the test unit i...

Embodiment 3

[0092] This embodiment provides a display device, including the array substrate in Embodiment 1 or 2.

[0093] By adopting the array substrate in Embodiment 1 or 2, not only the cost of the process capability test of the display device is reduced, but also the timeliness of the process capability test of the display device is improved.

[0094] The display device may be any product or component with a display function such as a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, a navigator, and the like.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an array substrate, a preparation method thereof, and a display device. The array substrate includes a multi-layer pattern layer in the display area and a test unit in the non-display area. The test unit includes at least one test component and a test transistor. The test component includes a test block pattern and a test line pattern; the test block pattern and the multi-layer pattern layer The same layer of the same layer, the test line pattern and the same layer of the multi-layer pattern layer, and the test block pattern and the test line pattern are different layers, the orthographic projection of the test line pattern on the array substrate corresponds to the orthographic projection of the test block pattern Periphery; a test block pattern or a test line pattern connected to the test transistor. The array substrate can realize the integrated test of the pattern size of the multi-layer pattern layer in the display area and the overlapping degree of the multi-layer pattern layer; it can also realize the integrated test of the transistor characteristics in the display area, thereby not only reducing the process test cost, but also Improve the timeliness of process testing.

Description

technical field [0001] The present invention relates to the field of display technology, in particular, to an array substrate, a manufacturing method thereof, and a display device. Background technique [0002] As people's demand for high-resolution displays is getting higher and higher, high-resolution display products have higher and higher requirements for process capabilities. Therefore, the timeliness requirements for process capability testing during the display manufacturing process are also relatively increased. [0003] Especially for polysilicon display devices with a top-gate structure, due to the large number of exposures in the manufacturing process of the display device, the process is relatively complicated. If the process cannot be immediately reflected in the production process, the product will be damaged. The production cost and time are greatly wasted, which requires monitoring the stability and accuracy of the process during or after the process. [000...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66H01L27/12H01L21/77
CPCH01L22/34H01L27/1222H01L27/127H01L27/124G02F1/1309H01L27/1214G02F1/136254H01L21/77H01L27/12G02F1/134363G02F1/136286G02F1/1368
Inventor 詹裕程张帅
Owner BOE TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com