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A Circuit Board Fault Location System and Method Based on Circuit Network and Graph Search

A fault location and circuit board technology, applied in electronic circuit testing, measuring electricity, measuring electrical variables, etc., can solve the problems of insufficient optimization of the number and distribution of test nodes, weak topology logic, and heavy workload.

Active Publication Date: 2018-10-02
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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Problems solved by technology

[0002] The circuit board needs to measure and collect the data of the intermediate nodes when locating the fault, and judge the circuit state according to the measurement results and analyze and deduce the next test strategy; currently, in the fault locating of the circuit board, it mainly relies on manual input of corresponding Test node information and determine the test sequence of nodes, the workload is heavy, the degree of automation is not high, and the number and distribution of test nodes are not optimized, and the topology logic is not strong

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  • A Circuit Board Fault Location System and Method Based on Circuit Network and Graph Search
  • A Circuit Board Fault Location System and Method Based on Circuit Network and Graph Search

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Embodiment

[0163] The overall structure of the development method studied by the present invention includes: realizing the functions of test attribute configuration, circuit graph management, test node configuration, test logic implementation, virtual online debugging, online debugging execution, data storage and data interface.

[0164] The concrete realization principle of the present invention is as figure 1 Shown:

[0165] The technical solution of the present invention realizes functions such as test configuration, circuit diagram management, test program (test program, TP for short) development and execution, virtual and online debugging, and has an interface with test and diagnosis knowledge based on artificial intelligence algorithms. The basic process of the method provided by the invention is as figure 2 As shown, the specific process steps include:

[0166] 1. Test attribute configuration

[0167] Test property configuration mainly includes three aspects: circuit interface...

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Abstract

The invention discloses a circuit board fault positioning system based on a circuit network and graph search. The circuit board fault positioning system comprises the components of a testing node attribute acquiring module which is used for acquiring attribute information of a testing node, wherein the attribute information comprises circuit interface attribute and testing execution attribute; a routing file acquiring module which is used for acquiring a routing file that is used for describing a line relationship between the channel of a testing instrument and the testing node; and an optimal node selecting module which is used for screening a manual testing node according to fault sensitivity and a fault isolation parameter; a testing logic generating module which is used for generating the testing logic of the node in an optimal node set obtained through screening based on the testing node attribute information and the routing file; and a testing result output module which is used for testing the selected testing point based on the obtained testing logic and furthermore finishes fault positioning of the circuit board.

Description

technical field [0001] The invention belongs to the technical field of circuit board testing and diagnosis, in particular to a circuit board fault location method based on circuit network and graph search. Background technique [0002] The circuit board needs to measure and collect the data of the intermediate nodes when locating the fault, and judge the circuit state according to the measurement results and analyze and deduce the next test strategy; currently, in the fault locating of the circuit board, it mainly relies on manual input of corresponding To test node information and determine the test sequence of nodes, the workload is heavy, the degree of automation is not high, and the number and distribution of test nodes are not optimized enough, and the topology logic is not strong. [0003] In order to improve the efficiency of TP development for circuit board testing and diagnosis, it is necessary to develop a circuit board fault location method based on circuit networ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2813
Inventor 冯建呈潘国庆田志昊王占选
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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