Background clutter measurement method based on edge structures

A technology of background clutter and edge structure, applied in the field of image processing, can solve the problem that the edge and texture structure information of the image cannot be well reflected, and achieve the effect of good consistency

Inactive Publication Date: 2016-06-08
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

Many researchers have found that the human eye is the most sensitive and valued to the edge structure information of the image, that is to say, the edge structure information is likely to be the most important part of the image structure information, and as the most important third part of SSIM structure In the comparison of information, s(x, y) essentially ob

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  • Background clutter measurement method based on edge structures
  • Background clutter measurement method based on edge structures
  • Background clutter measurement method based on edge structures

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Embodiment Construction

[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0024] refer to figure 1 , the specific implementation steps of the background clutter measurement method based on the edge structure of the present invention are as follows:

[0025] Step 1: Divide the background image into l small units of equal size, and the size of each unit is consistent with the size of the target image.

[0026] Step 2: Refer to the structural similarity measure to establish the similarity measure of the target and background clutter in the image structure feature space.

[0027] Let T = {t i |i=1,2,…N},c={c i |i=1,2,...,N} are target and background clutter signals respectively, let X={x i |i=1,2,…,N}, Y={y i |i=1,2,…,N} are target and background clutter signals respectively, μ X , μ Y , σ X , σ Y , σ XY Represent the mean, standard deviation and covariance of X and Y respectively, and the specific definitions...

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Abstract

The invention relates to a background clutter measurement method based on edge structures, comprising the following steps: segmenting a background image into cells of the same size as a target image; establishing a similarity measure between the target image and cell background clutter images in an image structure feature space; establishing edge structure feature descriptions of the target image and the cell background clutter images through a gradient histogram method, and selecting a Bhattacharyya coefficient to calculate the similarity measure between the image edge structures; and weighting the structure similarity measure between the target image and each cell background clutter image as the clutter measure of the cell background image based on the edge structure similarity measure between the target image and the cell background clutter image, and taking the average clutter measure of all the cell background images as the clutter measure of the whole background image. The method fully embodies the fact that human eye vision mainly focuses on the object structure in target identification, and improves the accuracy of imaging system field performance prediction and evaluation.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a method for measuring background clutter based on edge structure. Background technique [0002] With the continuous improvement of optical system, detector and circuit design, background clutter has gradually become the main factor affecting the performance of photoelectric imaging system. The complex clutter background environment contains scene content of many types of targets, which makes it impossible for the observer to acquire the target quickly and effectively. The background clutter effect becomes an increasingly important factor affecting the target acquisition performance of the observer. [0003] Accurate and effective quantitative description of clutter is one of the hotspots and difficulties in the field of optoelectronic imaging system performance evaluation and image processing, which lays the foundation for establishing accurate target acquisition perfor...

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Application Information

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IPC IPC(8): G06T7/00
Inventor 史泽林夏仁波王学娟向伟惠斌王喆鑫
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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