Background clutter measurement method based on edge structures
A technology of background clutter and edge structure, applied in the field of image processing, can solve the problem that the edge and texture structure information of the image cannot be well reflected, and achieve the effect of good consistency
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[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0024] refer to figure 1 , the specific implementation steps of the background clutter measurement method based on the edge structure of the present invention are as follows:
[0025] Step 1: Divide the background image into l small units of equal size, and the size of each unit is consistent with the size of the target image.
[0026] Step 2: Refer to the structural similarity measure to establish the similarity measure of the target and background clutter in the image structure feature space.
[0027] Let T = {t i |i=1,2,…N},c={c i |i=1,2,...,N} are target and background clutter signals respectively, let X={x i |i=1,2,…,N}, Y={y i |i=1,2,…,N} are target and background clutter signals respectively, μ X , μ Y , σ X , σ Y , σ XY Represent the mean, standard deviation and covariance of X and Y respectively, and the specific definitions...
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