Fiber end interferometer clamping and judging device and judging method

Abstract

The invention discloses a fiber end interferometer clamping and judging device and a judging method. The fiber end interferometer is provided with a clamping wrench, and comprises a light source, a first photoelectric detector, a second photoelectric detector, filters, a signal processing circuit, a fixing table, and a single chip microcomputer, wherein the light source, the first photoelectric detector and the second photoelectric detector are all arranged on the fixing table; both the first photoelectric detector and the second photoelectric detector are provided with the filters for filtering stray lights whose wavelengths are not that of the light source; when the clamping wrench is clamped, the reflection surface on the clamping wrench reflects light emitted by the light source to the first detector or the second detector; the light source, the first photoelectric detector and the second photoelectric detector are all connected with the signal processing circuit; and the signal processing circuit is connected with the single chip microcomputer. By adopting the photoelectric sensor, the response time is within 0.1 s, and a detected piece can be quickly judged to be in a clamping or relaxing state; and the device and the method of the invention have the advantages of high testing efficiency, strong anti-interference ability, low cost and the like.

Description

technical field [0001] The invention relates to the fields of optical communication technology, interferometry, and surface geometric parameter measurement, in particular to a clamping judging device and judging method for an optical fiber end face interferometer. Background technique [0002] Optical fiber end-face interferometry is the standard test method for the end face of optical fiber connectors stipulated by the International Electrotechnical Commission (IEC) and Telcordia. Many companies in the world have developed corresponding test instruments, which can achieve horizontal micron-level and longitudinal nano-level measurement accuracy. . This high-precision instrument is widely used in optical passive devices containing optical fiber connectors such as optical fiber jumpers, pigtails, and PLC splitters. The global annual demand for these devices has reached more than 100 million pieces. Connectors measured by interferometers and reaching international standards ha...

AI Technical Summary

Problems solved by technology

[0003] However, when the test volume of the user is large, the disadvantage of the existing equipment is that the clamping takes a long time, which affects the test efficiency. Or the keyboard starts the three actions of the measurement program, which cannot be completed with two hands at the same time, thus resulting in a lower test speed as a whole

Images