Open-circuit test methods for AVSS pin and VSS pin

Abstract

The invention discloses open-circuit test methods for an AVSS pin and a VSS pin. The open-circuit test method for an AVSS pin comprises: one pin is selected from AVSS-system pins of a chip as a testing pin, wherein the AVSS-system pins are ones using analog power supplies for power supplying among all pins of the chip; currents are applied to the rest of pins among the AVSS-system pins and voltages of the testing pin is measured; the voltage value of the testing pin is compared with testing pin voltage values that are obtained in advance under the circumstance that the AVSS pins are not treated by open-circuit processing; if the voltage value of the testing pin is higher than the testing pin voltage values under the circumstance that the AVSS pins are not treated by open-circuit processing, the AVSS pins are determined to be in an open-circuit state, wherein the AVSS pins and VSS pints of the chip are in short circuit by a lead frame. According to the invention, for the chip with the VSS and AVSS pints in short circuit by the lead frame, whether the AVSS or VSS pins are in an open circuit is determined; and the testing time is short.

Description

technical field [0001] The invention relates to the technical field of open-circuit testing of chip pins, in particular to an open-circuit testing method for AVSS pins and VSS pins. Background technique [0002] During the packaging process of the chip, in order to save the number of pins of the chip, the pins with similar functions will be short-circuited inside the chip and packaged into one pin. It is more common that the digital ground (VSS) and the analog ground (AVSS) are shorted through the lead frame, and the packaged product has only one ground pin. This method of shorting through the lead frame is called Irlandbonding, and its schematic diagram is as follows figure 1 as shown, figure 1 Shown in the circle is to short VSS and AVSS through the lead frame. [0003] Open-short test (OpenShortTest, ie O / S test), also known as continuity test (ContinuityTest) or contact test (ContactTest), can very quickly find out whether there is a short circuit between the pins of ...

AI Technical Summary

Problems solved by technology

[0006] The present invention provides an open-circuit test method for AVSS pins and VSS pins, so as to at least solve the problem that the existing open-short-circuit test method cannot determine the ground tube for products packaged by short-circuiting the VSS pins and AVSS pins through a lead frame. The question of whether the foot is open

Images