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Improvements relating to particle characterisation

A particle and characterization technology, applied in individual particle analysis, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of improving the signal-to-noise ratio

Active Publication Date: 2016-06-22
MALVERN INSTRUMENTS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] This tends to cause further problems in the existing field of particle characterization systems if the dispersant is water

Method used

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  • Improvements relating to particle characterisation
  • Improvements relating to particle characterisation
  • Improvements relating to particle characterisation

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0221] refer to figure 1 , shows a prior art device 10 for particle characterization comprising a light source 2 for illuminating a sample chamber 20 with a light beam 8 . Apparatus 10 further includes a plurality of detectors (not shown) for detecting light scattered from the sample within sample chamber 20 . Light source 2 is a relatively large helium-neon laser. The first mirror (mirror) 4 and the second mirror 4 are used to bend the optical path of the beam 8 by two 90 degrees, so that the light source 2 can be accommodated under the optical path of the beam 8 passing through the sample. This provides a relatively compact device, but enables indirect heating of the sample by the light source, for example, by convective heat transfer. A triplet lens 6 is arranged between the second mirror 4 and the sample chamber 20 to provide the necessary beam quality through the sample. A beam of light 8 is converged through the sample.

[0222] figure 2 The sample chamber 30 is sh...

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Abstract

A particle characterisation apparatus is disclosed comprising: a light source; a sample cell; a collecting lens and a detector. The light source is operable to illuminate a sample comprising dispersed particles within the sample cell with a light beam along a light beam axis. The light beam axis passes through a first wall of the sample cell, through the sample, and through a second wall of the sample cell, so as to produce scattered light by interactions with the sample. The detector is configured to detect light scattered from the sample. The second wall of the sample cell comprises a lens with a convex external surface through which the light beam axis passes. The collecting lens is arranged to collect and focus scattered light leaving the sample cell onto the detector, and comprises an aspheric surface.

Description

technical field [0001] The invention relates to a device for characterizing particles and to a method for characterizing particles. Characterizing the particles can include determining the particle size distribution. Background technique [0002] It is known that particles in a sample can be characterized by illuminating the sample and measuring the light scattered by the particles. During the measurement, the particles of the sample are usually dispersed in a sample cell in a dispersant medium. The dispersant medium is usually air or water and usually flows through the sample chamber during the measurement. [0003] In this type of instrument, the sample chamber typically has a pair of flat, parallel transparent walls, and the sample is illuminated through the first wall. Forward scattered light exits the sample chamber via the opposing second wall, and backscattered light exits the sample chamber via the first wall. This arrangement is suitable for measuring both the r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02G02B3/00G01N21/49G01N15/14
CPCG01N15/0205G01N15/0211G01N15/1456G01N21/51G01N2021/4707G01N2021/4709G01N2021/4711G02B3/02
Inventor 大卫·斯普里格斯
Owner MALVERN INSTRUMENTS
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