Improvements relating to particle characterisation
A particle and characterization technology, applied in individual particle analysis, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of improving the signal-to-noise ratio
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[0221] refer to figure 1 , shows a prior art device 10 for particle characterization comprising a light source 2 for illuminating a sample chamber 20 with a light beam 8 . Apparatus 10 further includes a plurality of detectors (not shown) for detecting light scattered from the sample within sample chamber 20 . Light source 2 is a relatively large helium-neon laser. The first mirror (mirror) 4 and the second mirror 4 are used to bend the optical path of the beam 8 by two 90 degrees, so that the light source 2 can be accommodated under the optical path of the beam 8 passing through the sample. This provides a relatively compact device, but enables indirect heating of the sample by the light source, for example, by convective heat transfer. A triplet lens 6 is arranged between the second mirror 4 and the sample chamber 20 to provide the necessary beam quality through the sample. A beam of light 8 is converged through the sample.
[0222] figure 2 The sample chamber 30 is sh...
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