Trial cutting device for analysis of workpiece surface quality problems and analysis method

A technology for quality problems and workpiece surfaces, applied to metal processing machinery parts, manufacturing tools, metal processing equipment, etc., can solve problems such as inaccurate cause location and long processing cycle, and achieve rapid cause finding, accurate cause analysis, and trial cutting Programs are flexible and variable

Active Publication Date: 2016-06-29
CHENGDU AIRCRAFT INDUSTRY GROUP
View PDF10 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problems of inaccurate positioning and long processing period in the prior art. The present invention provides a workpiece surface quality problem analysis trial cutting device and analysis method. Through the independent processing of each coordinate axis, Decompose the workpiece surface quality problems caused by complex multi-axis simultaneous processing, and realize accurate and rapid positioning of the cause of the fault

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Trial cutting device for analysis of workpiece surface quality problems and analysis method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] As a preferred embodiment of the present invention, with reference to the attached figure 1 , this embodiment discloses a workpiece surface quality problem analysis trial cutting device, this embodiment includes:

[0036] A workpiece surface quality problem analysis test cutting device, including a base, the base is rectangular, and the base is equipped with an X-axis test piece 1, a Y-axis test piece 2, a Z-axis test piece 3, an A-axis test piece 4, and a B-axis -C-axis test piece 5 and origin hole 6; the X-axis test piece 1, the Y-axis test piece 2 and the A-axis test piece 4 are all strip-shaped protrusions, and are all parallel to the edge of the base; the X-axis Test piece 1 is set on the edge of the base, Y-axis test piece 2 and A-axis test piece 4 are respectively set on the edge of the base adjacent to X-axis test piece 1; and set in the middle of the base; the origin hole 6 is a blind hole set in the middle of the top plane of the Z-axis test piece 3; the B-ax...

Embodiment 2

[0076] As a preferred embodiment of the present invention, with reference to the attached figure 1 , this embodiment discloses a workpiece surface quality problem analysis trial cutting device, this embodiment includes:

[0077] A workpiece surface quality problem analysis test cutting device, including a base, the base is rectangular, and the base is equipped with an X-axis test piece 1, a Y-axis test piece 2, a Z-axis test piece 3, an A-axis test piece 4, and a B-axis -C-axis test piece 5 and origin hole 6; the X-axis test piece 1, the Y-axis test piece 2 and the A-axis test piece 4 are all strip-shaped protrusions, and are all parallel to the edge of the base; the X-axis Test piece 1 is set on the edge of the base, Y-axis test piece 2 and A-axis test piece 4 are respectively set on the edge of the base adjacent to X-axis test piece 1; and set in the middle of the base; the origin hole 6 is a blind hole set in the middle of the top plane of the Z-axis test piece 3; the B-ax...

Embodiment 3

[0080] As a preferred embodiment of the present invention, with reference to the attached figure 1 , this embodiment discloses a method for analyzing and trying to cut workpiece surface quality problems, this embodiment includes:

[0081] A workpiece surface quality problem analysis test cutting device, including a base, the base is rectangular, and the base is equipped with an X-axis test piece 1, a Y-axis test piece 2, a Z-axis test piece 3, an A-axis test piece 4, and a B-axis -C-axis test piece 5 and origin hole 6; the X-axis test piece 1, the Y-axis test piece 2 and the A-axis test piece 4 are all strip-shaped protrusions, and are all parallel to the edge of the base; the X-axis Test piece 1 is set on the edge of the base, Y-axis test piece 2 and A-axis test piece 4 are respectively set on the edge of the base adjacent to X-axis test piece 1; and set in the middle of the base; the origin hole 6 is a blind hole set in the middle of the top plane of the Z-axis test piece 3...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the field of machining, in particular to a trial cutting device for the analysis of workpiece surface quality problems and an analysis method. The trial cutting device comprises a base, wherein the base is rectangular, and an X-axis test component, a Y-axis test component, a Z-axis test component, an A-axis test component, a B-axis-C-axis test component and an origin hole are arranged on the base; the X-axis test component, the Y-axis test component and the A-axis test component are all parallel with the edges of the base; the X-axis test component is arranged on the edge of the base, and the Y-axis test component and the A-axis test component are separately arranged on the edges, adjacent to the X-axis test component, of the base; the Z-axis test component is a bulge with a trapezoidal longitudinal section and is arranged in the middle of the base; the origin hole is formed in the middle of the top plane of the Z-axis test component; and the B-axis-C-axis test component is a ring and is arranged between the Z-axis test component and the X-axis test component and between the Y-axis test component and the A-axis test component. Through the independent processing of coordinates, workpiece surface quality problems caused by complicated multi-axis simultaneous processing are solved, and the accurate and rapid positioning of failure reasons is realized.

Description

technical field [0001] The invention relates to the field of mechanical processing, in particular to a device and analysis method for analysis and trial cutting of workpiece surface quality problems. Background technique [0002] Surface quality is an important indicator for evaluating the quality of a workpiece. The vibration of the coordinate axis of the machine tool during processing will cause surface quality problems on the workpiece. When the machine tool processes complex workpieces, multiple coordinate axes participate in the processing at the same time, which will cause surface quality problems. The reasons become more complicated. At present, there are mainly two methods for judging this problem. One is to formulate a sequence based on experience, and to overhaul each coordinate axis. The accuracy of this method is based on the experience of machine tool maintenance personnel, and there are often a large number of problems caused by inaccurate positioning. Useless...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): B23Q17/00
CPCB23Q17/00B23Q2017/001
Inventor 张伟伟宋智勇夏远猛乔永忠李颖
Owner CHENGDU AIRCRAFT INDUSTRY GROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap